Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Larcher, Luca
238  Ergebnisse:
Personensuche X
?
1

Blocking Oxide Material Engineering to Improve Retention Lo..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Rollo, Tommaso ; Lo, Hansel ; Larcher, Luca.. - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
?
2

Characterization and Multiscale Modeling of TDDB in State-o..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Palmieri, Andrea ; Tavakoli, Mahdi ; Ching, Chi... - p. 10A.3-1-10A.3-6 , 2024
Link: https://doi.org/10.1109/..
 
?
3

Modeling GAA Nanosheet Devices Accounting for Quantum-Mecha..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Larcher, Luca - p. 1-1 , 2024
Link: https://doi.org/10.1109/..
 
?
4

Low-PBTS defect-engineered high-mobility metal-oxide BEOL t..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Bcltrando, Bastien ; Coppolelli, Bruno ; Kim, Jung-Bae... - p. 4A.2-1-4A.2-6 , 2024
Link: https://doi.org/10.1109/..
 
?
5

Impact of Device Geometry, Physical Doping and Electrostati..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Palmieri, Andrea ; Cherkaoui, Karim ; Aabrar, Khandker Akif... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
?
6

Electrically active defects in Al2O3-InGaAs MOS stacks at c..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
La Torraca, Paolo ; Padovani, Andrea ; Wernersson, Lars-Erik... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
?
7

Insights into device and material origins and physical mech..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Pesic, Milan ; Beltrando, Bastien ; Rollo, Tommaso... - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
?
8

Towards a Universal Model of Dielectric Breakdown:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Padovani, Andrea ; Torraca, Paolo La ; Strand, Jack... - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
?
9

Modeling Degradation and Breakdown in SiO2 and High-k Gate ..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Padovani, Andrea ; Torraca, Paolo La ; Larcher, Luca.. - p. 93-96 , 2023
Link: https://doi.org/10.23919..
 
?
10

Device‐to‐Materials Pathway for Electron Traps Detection in..:

Slassi, Amine ; Medondjio, Linda‐Sheila ; Padovani, Andrea...
Advanced Electronic Materials.  9 (2023)  4 - p. , 2023
Link: https://doi.org/10.1002/..
 
?
11

BELLO: A post-processing tool for the local-order analysis ..:

Dianat, Behnood ; Tavanti, Francesco ; Padovani, Andrea..
Computational Materials Science.  209 (2022)  - p. 111381 , 2022
Link: https://doi.org/10.1016/..
 
?
12

Dielectric breakdown in HfO2 dielectrics: Using multiscale ..:

Strand, Jack ; La Torraca, Paolo ; Padovani, Andrea..
Journal of Applied Physics.  131 (2022)  23 - p. , 2022
Link: https://doi.org/10.1063/..
 
?
13

The electrons' journey in thick metal oxides:

Caruso, Francesco ; La Torraca, Paolo ; Larcher, Luca..
Applied Physics Letters.  121 (2022)  1 - p. , 2022
Link: https://doi.org/10.1063/..
 
?
14

Reliability of Non-Volatile Memory Devices for Neuromorphic..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Padovani, Andrea ; Pesic, Milan ; Nardi, Federico... - p. 1-10 , 2022
Link: https://doi.org/10.1109/..
 
?
15

Electron-assisted switching in FeFETs: Memory window dynami..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Pesic, Milan ; Beltrando, Bastien ; Padovani, Andrea... - p. 4A.1-1-4A.1-8 , 2022
Link: https://doi.org/10.1109/..
 
1-15