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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
1
Effective Defect Localization for Scan ATPG Failure through..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
2
Failure analysis on MIMCAP failures of 10nm devices using p..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
3
Internal Power Net Defect Localization Via Holistic Fault I..:
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Proceedings of the 2019 5th International Conference on Computing and Data Engineering ,
13