Lavieville, R.
26  Ergebnisse:
Personensuche X
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1

Toward the Understanding on Threshold Voltage Drift Mechani..:

Leurquin, C. ; Vandendaele, W. ; Jaud, M.-A....
IEEE Transactions on Electron Devices.  71 (2024)  5 - p. 3123-3129 , 2024
 
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2

Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Volta..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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4

Low Temperature Characterization of Hole Mobility in Sub-14..:

Laviéville, R. ; Le Royer, C. ; Barraud, S..
Journal of Physics: Conference Series.  834 (2017)  - p. 012001 , 2017
 
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5

A CMOS silicon spin qubit:

Maurand, R. ; Jehl, X. ; Kotekar-Patil, D....
Nature Communications.  7 (2016)  1 - p. , 2016
 
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6

Gate-reflectometry dispersive readout and coherent control ..:

Crippa, A ; Ezzouch, R ; Aprá, A...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6610084/.  , 2019
 
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8

Gate-reflectometry dispersive readout and coherent control ..:

Crippa, A ; Ezzouch, R ; Aprá, A...
info:eu-repo/semantics/altIdentifier/arxiv/1811.04414.  , 2019
 
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9

Gate-reflectometry dispersive readout and coherent control ..:

Crippa, A ; Ezzouch, R ; Aprá, A...
info:eu-repo/semantics/altIdentifier/arxiv/1811.04414.  , 2019
 
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10

Statistical characterization and modeling of drain current ..:

Karatsori, T ; Theodorou, C ; Lavieville, R...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS.2017.7954263.  , 2017
 
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11

Low Temperature Characterization of Hole Mobility in Sub-14..:

Lavieville, R ; Le Royer, C ; Barraud, S.
info:eu-repo/semantics/altIdentifier/doi/10.1088/1742-6596/834/1/012001.  , 2017
 
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12

Design and Operation of CMOS-Compatible Electron Pumps Fabr..:

Clapera, P ; Klochan, J ; Lavieville, R...
info:eu-repo/grantAgreement/EC/FP7/610637/EU/Silicon at the Atomic and Molecular scale/SIAM.  , 2017
 
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14

Low Temperature Characterization of Hole Mobility in Sub-14..:

Lavieville, R ; Le Royer, C ; Barraud, S.
info:eu-repo/grantAgreement/EC/FP7/619325/EU/Compound Semiconductors for 3D integration/COMPOSE3.  , 2016
 
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15

A CMOS silicon spin qubit:

Maurand, R ; Jehl, X ; Kotekar-Patil, D...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC5123048/.  , 2016
 
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