E-LIB Suche - Ergebnisse für: Le Cunff, Delphine

1

Hybridization of ellipsometry and XPS energy loss: Robust b..:

Levert, Théo ; Zakhtser, Alter ; Duval, Julien...
Microelectronic Engineering. 283 (2024) - p. 112117 , 2024

Link: https://doi.org/10.1016/..

2

Combining Full Wafer Inspection with Deep Learning to Recog..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Anger, Sabrina ; Yayak, Anil Bora ; Roeder, Georg... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

3

Guest Editorial Special Section on the 2022 SEMI Advanced S..:

Bickford, Jeanne Paulette ; Patterson, Oliver D. ; Le Cunff, Delphine...
IEEE Transactions on Semiconductor Manufacturing. 36 (2023) 3 - p. 307-310 , 2023

Link: https://doi.org/10.1109/..

4

Full Wafer Process Control Through Object Detection Using R..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Alcaire, Thomas ; Le Cunff, Delphine ; Tortai, Jean-Herve... - p. 1-5 , 2022

Link: https://doi.org/10.1109/..

5

Efficient Rigorous Coupled-Wave Analysis Simulation of Muel..:

Pham, Hoang-Lam ; Alcaire, Thomas ; Soulan, Sebastien..
Nanomaterials. 12 (2022) 22 - p. 3951 , 2022

Link: https://doi.org/10.3390/..

6

Hybridization of ellipsometry and energy loss spectra from ..:

Resende, Joao ; Fuard, David ; Le Cunff, Delphine..
Materials Chemistry and Physics. 259 (2021) - p. 124000 , 2021

Link: https://doi.org/10.1016/..

7

Spectroscopic Ellipsometry Imaging for Process Deviation De..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Alcaire, Thomas ; Cunff, Delphine Le ; Gredy, Victor. - p. 1-6 , 2020

Link: https://doi.org/10.1109/..

8

Dark-field electron holography as a recording of crystal di..:

Boureau, Victor ; Durand, Aurèle ; Gergaud, Patrice...
Journal of Applied Crystallography. 53 (2020) 4 - p. 885-895 , 2020

Link: https://doi.org/10.1107/..

9

Hybridization of ellipsometry and Xps energy loss: robust b..:

Levert, Théo ; Zakhtser, Alter ; Duval, Julien...
info:eu-repo/semantics/altIdentifier/doi/10.2139/ssrn.4554544. , 2023

Link: https://hal.science/hal-..

10

Hybridization of ellipsometry and Xps energy loss: robust b..:

Levert, Théo ; Zakhtser, Alter ; Duval, Julien...
info:eu-repo/semantics/altIdentifier/doi/10.2139/ssrn.4554544. , 2023

Link: https://hal.science/hal-..

11

Hybridization of ellipsometry and Xps energy loss: robust b..:

Levert, Théo ; Zakhtser, Alter ; Duval, Julien...
info:eu-repo/semantics/altIdentifier/doi/10.2139/ssrn.4554544. , 2023

Link: https://hal.science/hal-..

12

Sensitivity analysis of optical scatterometry technique for..:

Grasland, Justine ; Le Cunff, Delphine ; Pham, Hoang Lam..
info:eu-repo/semantics/altIdentifier/doi/10.1117/12.2657876. , 2023

Link: https://hal.science/hal-..

13

Hybridization of ellipsometry and Xps energy loss: robust b..:

Levert, Théo ; Zakhtser, Alter ; Duval, Julien...
info:eu-repo/semantics/altIdentifier/doi/10.2139/ssrn.4554544. , 2023

Link: https://hal.science/hal-..

14

Sensitivity analysis of optical scatterometry technique for..:

Grasland, Justine ; Le Cunff, Delphine ; Pham, Hoang Lam..
info:eu-repo/semantics/altIdentifier/doi/10.1117/12.2657876. , 2023

Link: https://hal.science/hal-..

15

Sensitivity analysis of optical scatterometry technique for..:

Grasland, Justine ; Le Cunff, Delphine ; Pham, Hoang Lam..
info:eu-repo/semantics/altIdentifier/doi/10.1117/12.2657876. , 2023

Link: https://hal.science/hal-..