E-LIB Suche - Ergebnisse für: Le-Cunff, Delphine

1

The Impact of Surface Voltage on Photoluminescence Response..:

Nassiet, Thomas ; Duru, Romain ; Le-Cunff, Delphine..
physica status solidi (a). 219 (2021) 9 - p. , 2021

Link: https://doi.org/10.1002/..

2

Investigation of Photoluminescence Voltage PL-V Measurement..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Nassiet, Thomas ; Duru, Romain ; Le-Cunff, Delphine... - p. 1-6 , 2020

Link: https://doi.org/10.1109/..

3

In-line monitoring of strain distribution using high resolu..:

Durand, Aurèle ; Kaufling, Melissa ; Le-Cunff, Delphine..
Materials Science in Semiconductor Processing. 70 (2017) - p. 99-104 , 2017

Link: https://doi.org/10.1016/..

4

Photoluminescence for in-line buried defects detection in s..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Duru, Romain ; Le-Cunff, Delphine ; Cannac, Maxime... - p. 262-266 , 2017

Link: https://doi.org/10.1109/..

5

Synthesis and Nanoarchitectonics of Novel Squaraine Derivat..:

Vuk, Dragana ; Radovanović-Perić, Floren ; Mandić, Vilko...
Nanomaterials. 12 (2022) 7 - p. 1206 , 2022

Link: https://doi.org/10.3390/..

6

Review of applications of Defect Photoluminescence Imaging ..:

, In: 2019 19th International Workshop on Junction Technology (IWJT),

Jastrzebski, L. ; Roffarello ; Nadudvari, G.... - p. 1-6 , 2019

Link: https://doi.org/10.23919..

7

Iodine doping of CdTe and CdZnTe layers grown by molecular ..:

Brun-Le-Cunff, D. ; Baron, T. ; Daudin, B...
Applied Physics Letters. 67 (1995) 7 - p. 965-967 , 1995

Link: https://doi.org/10.1063/..

8

Stoichiometry determination of the Te-rich (100) CdTe and (..:

Daudin, B. ; Brun-Le Cunff, D. ; Tatarenko, S.
Surface Science. 352-354 (1996) - p. 99-104 , 1996

Link: https://doi.org/10.1016/..

9

Ohmic contacts on n-type CdTe and CdZnTe using coherently g..:

Brun-Le Cunff, D. ; Daudin, B. ; Rouvière, J. L.
Applied Physics Letters. 69 (1996) 4 - p. 514-516 , 1996

Link: https://doi.org/10.1063/..

10

Anisotropic relaxation during the first stages of the growt..:

Eymery, J. ; Daudin, B. ; Brun-Le Cunff, D...
Applied Physics Letters. 66 (1995) 25 - p. 3456-3458 , 1995

Link: https://doi.org/10.1063/..

11

Zn and Te desorption from the (100) ZnTe surface:

Tatarenko, S. ; Daudin, B. ; Brun-Le Cunff, D.
Applied Physics Letters. 66 (1995) 14 - p. 1773-1775 , 1995

Link: https://doi.org/10.1063/..

12

Hybridization of ellipsometry and XPS energy loss: Robust b..:

Levert, Théo ; Zakhtser, Alter ; Duval, Julien...
Microelectronic Engineering. 283 (2024) - p. 112117 , 2024

Link: https://doi.org/10.1016/..

13

Guest Editorial Special Section on the 2022 SEMI Advanced S..:

Bickford, Jeanne Paulette ; Patterson, Oliver D. ; Le Cunff, Delphine...
IEEE Transactions on Semiconductor Manufacturing. 36 (2023) 3 - p. 307-310 , 2023

Link: https://doi.org/10.1109/..

14

Combining Full Wafer Inspection with Deep Learning to Recog..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Anger, Sabrina ; Yayak, Anil Bora ; Roeder, Georg... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

15

Efficient Rigorous Coupled-Wave Analysis Simulation of Muel..:

Pham, Hoang-Lam ; Alcaire, Thomas ; Soulan, Sebastien..
Nanomaterials. 12 (2022) 22 - p. 3951 , 2022

Link: https://doi.org/10.3390/..