E-LIB Suche - Ergebnisse für: Lee, Chung Len

1

Self‐heating burn‐in pattern generation based on the geneti..:

Cheng, Zuolin ; Cui, Xiaole ; Cui, Xiaoxin.
IET Computers & Digital Techniques. 9 (2015) 6 - p. 300-310 , 2015

Link: https://doi.org/10.1049/..

2

Modeling and test for parasitic resistance and capacitance ..:

, In: 2012 12th Annual Non-Volatile Memory Technology Symposium Proceedings,

Pan, Xiujuan ; Cui, Xiaole ; Zha, Jin.. - p. 73-76 , 2012

Link: https://doi.org/10.1109/..

3

Soft breakdown of hafnium oxynitride gate dielectrics:

Wang, Jer Chyi ; Shie, De Ching ; Lei, Tan Fu.
Journal of Applied Physics. 98 (2005) 2 - p. , 2005

Link: https://doi.org/10.1063/..

4

Oscillation ring based interconnect test scheme for SOC:

, In: Proceedings of the 2005 Asia and South Pacific Design Automation Conference,

Li, Katherine Shu-Min ; Lee, Chung Len ; Su, Chauchin. - p. 184-187 , 2005

Link: https://dl.acm.org/doi/1..

5

Carrier Transportation of Rapid Thermal Annealed CeO[sub 2]..:

Wang, Jer Chyi ; Chiang, Kuo Cheng ; Lei, Tan Fu.
Electrochemical and Solid-State Letters. 7 (2004) 12 - p. E55 , 2004

Link: https://doi.org/10.1149/..

6

Highly Reliable Nickel Silicide Formation with a Zr Capping..:

Lee, Tsung Lin ; Lee, Jam Wem ; Lee, Mei Chi..
Electrochemical and Solid-State Letters. 6 (2003) 5 - p. G66 , 2003

Link: https://doi.org/10.1149/..

7

Characterization of Temperature Dependence for HfO[sub 2] G..:

Wang, Jer Chyi ; Shie, De Ching ; Lei, Tan Fu.
Electrochemical and Solid-State Letters. 6 (2003) 10 - p. F34 , 2003

Link: https://doi.org/10.1149/..

8

Effects of BCl3Passivation on Pt/Al/n-InP Diodes:

Huang, Wen Chang ; Lei, Tan Fu ; Lee, Chung Len
Japanese Journal of Applied Physics. 42 (2003) Part 1, No. 1 - p. 71-74 , 2003

Link: https://doi.org/10.1143/..

9

Characteristics of high breakdown voltage Schottky barrier ..:

Liou, Bor Wen ; Lee, Chung Len
Solid-State Electronics. 44 (2000) 4 - p. 631-638 , 2000

Link: https://doi.org/10.1016/..

10

Plasma effects of fluorine implantation on As+-doped polycr..:

Liou, Bor Wen ; Lee, Chung Len
Thin Solid Films. 379 (2000) 1-2 - p. 213-217 , 2000

Link: https://doi.org/10.1016/..

11

Improvement of Reliability of Metal-Oxide Semiconductor Fie..:

Lai, Chao Sung ; Chao, Tien Sheng ; Lei, Tan Fu...
Japanese Journal of Applied Physics. 37 (1998) 10R - p. 5507 , 1998

Link: https://doi.org/10.1143/..

12

Hydrogen and Oxygen Plasma Effects on Polycrystalline Silic..:

Liou, Bor Wen ; Lee, Chung Len ; Tan Fu Lei, Tan Fu Lei.
Japanese Journal of Applied Physics. 36 (1997) 6R - p. 3389 , 1997

Link: https://doi.org/10.1143/..

13

Effects of Bromine‐Methanol and Hydrogen Chloride Pretreatm..:

Huang, Wen Chang ; Lei, Tan Fu ; Lee, Chung Len
Journal of The Electrochemical Society. 144 (1997) 2 - p. 627-633 , 1997

Link: https://doi.org/10.1149/..

14

IDENTIFICATION OF ROBUST UNTESTABLE PATH DELAY FAULTS:

Wu, Wen Ching ; Lee, Chung Len ; Chen, Jwu E.
Journal of the Chinese Institute of Engineers. 20 (1997) 5 - p. 549-559 , 1997

Link: https://doi.org/10.1080/..

15

Suppression of Boron Penetration in BF2+-Implanted Poly-Si ..:

Chao, Tien Sheng ; Chu, Chih-Hsun ; Wang, Chuan Fu...
Japanese Journal of Applied Physics. 35 (1996) 12R - p. 6003 , 1996

Link: https://doi.org/10.1143/..