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2024 IEEE International Reliability Physics Symposium (IRPS) ,
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Effect of Off-State Stress on Data-Valid Window Margin for ..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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Development and Product Reliability Characterization of Adv..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
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Transistor Reliability Characterization for Advanced DRAM w..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
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