Lee, Yonghwan
1407  Ergebnisse:
Personensuche X
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1

Inspection Methodology for Improving Wafer Quality in Semic..:

, In: 2024 Joint International Conference on Digital Arts, Media and Technology with ECTI Northern Section Conference on Electrical, Electronics, Computer and Telecommunications Engineering (ECTI DAMT & NCON),
Kwon, So-Young ; Kim, Young-Hyung ; Lee, Yong-Hwan.. - p. 249-252 , 2024
 
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8

Research on Real-Time Image Stitching for Wafer Defect Insp..:

, In: 2023 International Conference on Computational Science and Computational Intelligence (CSCI),
Kwon, So-Young ; Kim, Young-Hyung ; Jung, Dong-Soo. - p. 1300-1301 , 2023
 
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11

Generative AI models for virtual interviewers: applicabilit..:

, In: International Conference on Innovation, Communication and Engineering (ICICE 2023),
Si, Jongwook ; Song, Jaeyong ; Woo, Minsik... - p. None , 2023
 
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