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Leijtens, XJM Xaveer
368  Ergebnisse:
Personensuche X
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1

Open standards for automation of testing of photonic integr..:

Latkowski, S Sylwester ; Pustakhod, D Dzmitry ; Yao, W Weiming.
ISSN:0792-1233.  , 2019
Link: http://repository.tue.nl..
 
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2

Increasing the speed of an InP-based integration platform b..:

Trajkovic, M Marija ; Blache, Fabrice ; Debregeas, Helene..
ISSN:1077-260X.  , 2019
Link: http://repository.tue.nl..
 
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3

Test methods and processes in manufacturing chain of photon..:

Latkowski, S Sylwester ; Pustakhod, D Dzmitry ; Yao, W Weiming.. , 2018
Link: http://repository.tue.nl..
 
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4

Method for polarization-resolved measurement of electroabso..:

Pustakhod, D Dzmitry ; Williams, KA Kevin ; Leijtens, XJM Xaveer
ISSN:1943-0655.  , 2018
Link: http://repository.tue.nl..
 
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5

Monolithically-integrated multi-wavelength laser with optic..:

Zhao, D Dan ; Andreou, S Stefano ; Yao, W Weiming...
ISSN:1943-0655.  , 2018
Link: http://repository.tue.nl..
 
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6

Influence of termination load placement on electro-absorpti..:

Trajkovic, M Marija ; Blache, Fabrice ; Debregeas, Helene.. , 2018
Link: http://repository.tue.nl..
 
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7

Deep UV lithography process in generic InP integration for ..:

Ambrosius, HPMM Huub ; Stabile, R Patty ; Latkowski, S Sylwester...
ISSN:1041-1135.  , 2018
Link: http://repository.tue.nl..
 
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8

A novel method for characterization of distributed Bragg re..:

Zhao, D Dan ; Pustakhod, D Dzmitry ; Williams, KA Kevin.
ISSN:1943-0655.  , 2018
Link: http://repository.tue.nl..
 
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9

Low loss transmission lines in COBRA generic photonic integ..:

Trajkovic, M Marija ; Blache, Fabrice ; Debregeas, Helene.. , 2018
Link: http://repository.tue.nl..
 
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10

Method for polarization-resolved measurement of electroabso..:

Pustakhod, D Dzmitry ; Williams, KA Kevin ; Leijtens, XJM Xaveer , 2018
Link: http://repository.tue.nl..
 
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11

55GHz EAM bandwidth and beyond in InP active-passive photon..:

Trajkovic, M Marija ; Blache, Fabrice ; Debregeas, Helene... , 2018
Link: http://repository.tue.nl..
 
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12

Fast and robust method for measuring semiconductor optical ..:

Pustakhod, D Dzmitry ; Williams, KA Kevin ; Leijtens, XJM Xaveer
ISSN:1077-260X.  , 2018
Link: http://repository.tue.nl..
 
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13

Optical frequency domain reflectometry for characterization..:

Zhao, D Dan ; Pustakhod, D Dzmitry ; Augustin, LM Luc.. , 2017
Link: http://repository.tue.nl..
 
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14

High resolution optical frequency domain reflectometry for ..:

Zhao, D Dan ; Pustakhod, D Dzmitry ; Williams, KA Kevin. , 2017
Link: http://repository.tue.nl..
 
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15

High resolution optical frequency domain reflectometry for ..:

Zhao, D Dan ; Pustakhod, D Dzmitry ; Williams, KA Kevin.
ISSN:1041-1135.  , 2017
Link: http://repository.tue.nl..
 
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