Leonardo H. Fazan
32  Ergebnisse:
Personensuche X
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5

High Performance Thermally Resistant FinFETs DRAM Periphera..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Ritzenthaler, R. ; Capogreco, E. ; Dupuy, E.... - p. 306-307 , 2022
 
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FinFETs with Thermally Stable RMG Gate Stack for Future DRA..:

, In: 2022 International Electron Devices Meeting (IEDM),
Capogreco, E. ; Arimura, H. ; Ritzenthaler, R.... - p. 26.2.1-26.2.4 , 2022
 
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9

Reliability Engineering Enabling Continued Logic for Memory..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
O'Sullivan, B. J. ; Linten, D. ; Horiguchi, N.... - p. 1-11 , 2019
 
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10

Strained c:Si0.55Ge0.45 with embedded e:Si0.75Ge0.25 S/D IF..:

Ritzenthaler, R. ; Schram, T. ; Witters, L....
Materials Science in Semiconductor Processing.  42 (2016)  - p. 255-258 , 2016
 
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11

Low-frequency noise assessment of border traps in Al2O3 cap..:

Simoen, E ; Federico, A ; Aoulaiche, M...
Semiconductor Science and Technology.  29 (2014)  11 - p. 115015 , 2014
 
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12

Use of scanning capacitance microscopy for controlling wafe..:

Jeandupeux, O ; Marsico, V ; Acovic, A...
Microelectronics Reliability.  42 (2002)  2 - p. 225-231 , 2002
 
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13

Impact of angiotensin-converting enzyme inhibition on hemod..:

Prates-Costa, T.C. ; Oliveira, M. de ; Fazan Jr, R...
Brazilian Journal of Medical and Biological Research.  55 (2022)  - p. , 2022
 
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