Schlottmann, Elisabeth ;
von Helversen, Martin ;
Leymann, Heinrich A. M...
Schlottmann , E , von Helversen , M , Leymann , H A M , Lettau , T , Krüger , F , Schmidt , M , Schneider , C , Kamp , M , Höfling , S , Beyer , J , Wiersig , J & Reitzenstein , S 2018 , ' Exploring the photon-number distribution of bimodal microlasers with a transition edge sensor ' , Physical Review Applied , vol. 9 , no. 6 , 064030 . https://doi.org/10.1103/PhysRevApplied.9.064030.
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2018