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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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The Concept of Safe Operating Area for Gate Dielectrics: th..:
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2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) ,
4
A Charge-to-Breakdown (QBD) Approach to SiC Gate Oxide Life..:
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2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) ,
7