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Letullier, P.
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Failure mechanisms and qualification testing of passive com..:

Post, H.A. ; Letullier, P. ; Briolat, T....
Microelectronics Reliability.  45 (2005)  9-11 - p. 1626-1632 , 2005
Link: https://doi.org/10.1016/..
 
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Dielectric properties of alumina lamellar ceramics:

Heintz, J.M. ; Letullier, P. ; Miane, J.L..
Materials Science and Engineering: B.  52 (1998)  1 - p. 84-88 , 1998
Link: https://doi.org/10.1016/..
 
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3

Failure mechanisms and qualification testing of passive com..:

Post, H.A ; Letullier, P ; Briolat, T...
Microelectronics Reliability, 45(9-10). p. 1626-1632.  , 2005
Link: http://hdl.handle.net/19..
 
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4

In vitro effect of five pharmaceuticals on the viability of..:

A. Letullier ; L. Minguez ; K. Costil...
http://www.pagepressjournals.org/index.php/xeno/article/view/4900.  , 2014
Link: https://doi.org/10.4081/..
 
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