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2023 IEEE International Reliability Physics Symposium (IRPS) ,
2
Drain voltage impact on charge redistribution in GaN-on-Si ..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
3
Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Volta..:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
4