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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
1
Novel Nano-probing Technique for Column Short Failure in Fl..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
7
EBIC Application in Finding Particle Defects:
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2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
15