E-LIB Suche - Ergebnisse für: Liang, Huaguo

1

A Quadruple-Node Upsets Hardened Latch Design Based on Cros..:

Huang, Zhengfeng ; Li, Zishuai ; Sun, Liting...
Journal of Electronic Testing. 40 (2024) 1 - p. 19-30 , 2024

2

A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Re..:

Xu, Hui ; Li, Jiuqi ; Ma, Ruijun...
IEEE Transactions on Device and Materials Reliability. 24 (2024) 2 - p. 302-312 , 2024

Link: https://doi.org/10.1109/..

3

SPONGE+: A NoC-based power gating scheme for overall router..:

Ouyang, Yiming ; Chen, Zhiyuan ; Xu, Dongyu.
Microelectronics Journal. 149 (2024) - p. 106234 , 2024

Link: https://doi.org/10.1016/..

4

Lightweight Hybrid Entropy Source True Random Number Genera..:

Yang, Shihao ; Liang, Huaguo ; Hu, Rong...
IEEE Transactions on Circuits and Systems II: Express Briefs. 71 (2024) 7 - p. 3513-3517 , 2024

Link: https://doi.org/10.1109/..

5

A highly reliable and low-overhead quadruple-node-upset tol..:

Xu, Hui ; Ai, Xiaodong ; Ma, Ruijun...
Microelectronics Reliability. 157 (2024) - p. 115413 , 2024

Link: https://doi.org/10.1016/..

6

Multi-transition Delay Test for Improving the Coverage of C..:

Zhang, Hong ; Liang, Huaguo ; Wang, Yue...
IEICE Electronics Express. , 2024

Link: https://doi.org/10.1587/..

7

A Symmetric Bridge-Based Pre-Bond TSV Faults Detection Meth..:

Liu, Jun ; Chen, Zhi ; Cheng, Songren...
IEEE Transactions on Instrumentation and Measurement. , 2024

Link: https://doi.org/10.1109/..

8

Reliability analysis and comparison of ring-PUF based on pr..:

Bian, Jingchang ; Huang, Zhengfeng ; Lin, Yankun...
Microelectronics Journal. 144 (2024) - p. 106072 , 2024

Link: https://doi.org/10.1016/..

9

NEST: A Quadruple-Node Upset Recovery Latch Design and Algo..:

Huang, Zhengfeng ; Sun, Liting ; Wang, Xu...
IEEE Transactions on Aerospace and Electronic Systems. , 2024

Link: https://doi.org/10.1109/..

10

High throughput dynamic dual entropy source true random num..:

Chen, Yu ; Liang, Huaguo ; Zhang, Linghui..
Microelectronics Journal. 145 (2024) - p. 106113 , 2024

Link: https://doi.org/10.1016/..

11

A tree-recursive partitioned multicast mechanism for NoC-ba..:

Ouyang, Yiming ; Zhang, Yihe ; Liang, Huaguo.
Microelectronics Journal. 147 (2024) - p. 106161 , 2024

Link: https://doi.org/10.1016/..

12

A new characterization model of FinFET self-heating effect ..:

Wang, Yue ; Liang, Huaguo ; Zhang, Hong...
Microelectronic Engineering. 287 (2024) - p. 112155 , 2024

Link: https://doi.org/10.1016/..

13

Voltage Skew-Based Test Technique for Pre-Bond TSVs in 3-D ..:

Liu, Jun ; Chen, Zhi ; Chen, Tian...
IEEE Transactions on Circuits and Systems II: Express Briefs. , 2024

Link: https://doi.org/10.1109/..

14

A High-Performance Quadruple-Node-Upset-Tolerant Latch Desi..:

Xu, Hui ; Qin, Xuewei ; Ma, Ruijun...
Journal of Electronic Testing. 40 (2024) 1 - p. 45-60 , 2024

Link: https://doi.org/10.1007/..

15

A self-training end-to-end mask optimization framework base..:

Xu, Hui ; Tang, Fuxin ; Qi, Pan...
Integration. 96 (2024) - p. 102150 , 2024

Link: https://doi.org/10.1016/..