Liao, Yongbo
151  Ergebnisse:
Personensuche X
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1

Classify breast cancer pathological tissue images using mul..:

Guo, Dongen ; Lin, Yuyao ; Ji, Kangyi...
Biomedical Signal Processing and Control.  96 (2024)  - p. 106607 , 2024
 
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2

The Research on the Fabrication of the Novel Basic Unit for..:

Liao, Yongbo ; Li, Ping ; Xu, Fenghe...
Journal of Physics: Conference Series.  2524 (2023)  1 - p. 012035 , 2023
 
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3

Design and Verification of High-Frequency Inverter for Effi..:

, In: 2023 Panda Forum on Power and Energy (PandaFPE),
 
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4

The Attention-Based Deep Neural Network DPD for Wideband Po..:

, In: 2023 6th International Conference on Electronics Technology (ICET),
Liao, Yongbo ; Mesfin, Gebre Fisehatsion ; Wen, Wu... - p. 342-346 , 2023
 
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5

The defects of reported TID reinforced structures and the i..:

Liao, Yongbo ; Liu, Yangmeng ; Li, Ping..
Microelectronics Reliability.  146 (2023)  - p. 115018 , 2023
 
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7

A reverse hysteresis effect of graphene transistors with am..:

Zhang, Qingwei ; Li, Ping ; Liao, Yongbo...
Microelectronics Reliability.  85 (2018)  - p. 118-121 , 2018
 
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8

A design of multi-mode excitation source for optical thermo..:

Zhu, Yuyu ; Gao, Bin ; Wu, Shichun...
Infrared Physics & Technology.  94 (2018)  - p. 23-31 , 2018
 
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10

Self‐aligned graphene transistor:

Zeng, Rongzhou ; Li, Ping ; Li, Junhong...
Electronics Letters.  53 (2017)  24 - p. 1592-1594 , 2017
 
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11

An embedded gate graphene field effect transistor with natu..:

Zeng, Rongzhou ; Li, Ping ; Wang, Yiwen...
IEICE Electronics Express.  14 (2017)  20 - p. 20170707-20170707 , 2017
 
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12

FPGA based spike-time dependent encoder and reservoir desig..:

Yi, Yang ; Liao, Yongbo ; Wang, Bin...
Microprocessors and Microsystems.  46 (2016)  - p. 175-183 , 2016
 
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13

A Built-In Self-Test (BIST) system with non-intrusive TPG a..:

Ruan, Aiwu ; Kang, Shi ; Wang, Yu...
Microelectronics Reliability.  53 (2013)  3 - p. 488-498 , 2013
 
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14

Graph theory for FPGA minimum configurations:

Ruan, Aiwu ; Li, Wenchang ; Xiang, Chuanyin...
Journal of Semiconductors.  32 (2011)  11 - p. 115018 , 2011
 
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