Lin, Chih-Hsuan
11142  Ergebnisse:
Personensuche X
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1

RESURF Region Variation Induced Current Crowding Effect on ..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Lee, Jian-Hsing ; Li, Ching-Ho ; Nidhi, Karuna... - p. 1-7 , 2023
 
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2

Bipolar Transistors' Holding Phenomena:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Huang, Shao-Chang ; Hsu, Kai-Chieh ; Lin, Chih-Hsuan... - p. 221-222 , 2023
 
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3

Self-Organized Germanium Quantum Dots/Si3N4 Enabling Monoli..:

Lin, Chih-Hsuan ; Hong, Po-Yu ; Lee, Bing-Ju...
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 2113-2120 , 2023
 
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5

Transmission Line Pulse Width Impacting on Device Performan..:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
 
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7

The Failure Mechanism of the Guard-Rings in Two Different P..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
 
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9

Monolithic Integration of Top Si3N4 - Waveguided Germanium ..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lin, Chih-Hsuan ; Hong, Po-Yu ; Lee, Bing-Ju... - p. 19.2.1-19.2.4 , 2022
 
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10

A Study of Motion Coding Schemes for Learned Video Compress..:

, In: 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI),
 
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11

Exploring the Effect of Emotion Awareness Intervention on R..:

, In: Extended Abstracts of the 2022 CHI Conference on Human Factors in Computing Systems,
 
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12

Gate Voltages Impacting on Latch-up Measurements:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
 
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13

Learned Video Compression for YUV 4:2:0 Content Using Flow-..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Ho, Yung-Han ; Lin, Chih-Hsuan ; Chen, Peng-Yu... - p. 829-833 , 2022
 
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14

EOS Endurance Power Circuits without Depletion Mode Devices:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
 
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15

Large array device characteristics improvements:

Huang, Shao-Chang ; Li, Ching-Ho ; Liao, Chih-Cherng...
Microelectronics Reliability.  125 (2021)  - p. 114353 , 2021
 
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