Lingley, Z.
7  Ergebnisse:
Personensuche X
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STEM EBIC for High-Resolution Electronic Characterization:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Hubbard, W. A. ; Lingley, Z. ; Theiss, J... - p. 1-5 , 2020
 
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Catastrophic Degradation in High-Power Buried Heterostructu..:

, In: 2019 Conference on Lasers and Electro-Optics (CLEO),
Sin, Y. ; Lingley, Z. ; Brodie, M.... - p. 1-2 , 2019
 
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Bismuth Particle Formation in Annealed Dilute GaAs i-x-y P ..:

Lingley, Z. R. ; Foran, B. ; Brodie, M....
Microscopy and Microanalysis.  22 (2016)  S3 - p. 1578-1579 , 2016
 
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Strain-compensated GaAs1−yPy/GaAs1−zBiz/GaAs1−yPyquantum we..:

Kim, H ; Forghani, K ; Guan, Y...
Semiconductor Science and Technology.  30 (2015)  9 - p. 094011 , 2015
 
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