Linn, Tobias
185  Ergebnisse:
Personensuche X
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1

A Godunov-type stabilization scheme for the Boltzmann trans..:

Leenders, Hendrik ; Luckner, Paul ; Linn, Tobias.
Journal of Computational Electronics.  23 (2024)  1 - p. 1-11 , 2024
 
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2

Device Modeling for Admittance Spectroscopy of PMOSFETs at ..:

Jungemann, Christoph ; Richstein, Benjamin ; Linn, Tobias.
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2322-2328 , 2024
 
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3

DC and Transient Microscopic Simulation of Nanowire NMOSFET:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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4

Stabilization of the Time-Dependent Drift-Diffusion Model f..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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5

An Accurate k*p Approximation of the Empirical Pseudopotent..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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6

Numerical aspects of a Godunov-type stabilization scheme fo..:

Noei, Maziar ; Luckner, Paul ; Linn, Tobias.
Journal of Computational Electronics.  21 (2022)  1 - p. 153-168 , 2022
 
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7

Device Simulation of the Dyakonov-Shur Plasma Instability f..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
 
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8

A Maximum Principle for Drift-Diffusion Equations and the S..:

, In: Scientific Computing in Electrical Engineering; Mathematics in Industry,
 
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9

A numerical approach to quasi-ballistic transport and plasm..:

Noei, Maziar ; Linn, Tobias ; Jungemann, Christoph
Journal of Computational Electronics.  19 (2020)  3 - p. 975-986 , 2020
 
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11

On the Simulation of Plasma Waves in HEMTs and the Dyakonov..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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13

Investigation of moments-based transport models applied to ..:

Linn, Tobias ; Kargar, Zeinab ; Jungemann, Christoph
Semiconductor Science and Technology.  34 (2018)  1 - p. 014002 , 2018
 
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14

Numerical simulation of plasma waves in a quasi-2D electron..:

Kargar, Zeinab ; Ruić, Dino ; Linn, Tobias.
Journal of Computational Electronics.  16 (2017)  3 - p. 487-496 , 2017
 
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