E-LIB Suche - Ergebnisse für: Lips, K

1

High-field/high-frequency EPR spectroscopy on synthetic mel..:

Paulin, J. V. ; Batagin-Neto, A. ; Naydenov, B...
Materials Advances. 2 (2021) 19 - p. 6297-6305 , 2021

Link: https://doi.org/10.1039/..

2

MR to go:

Anders, J. ; Lips, K.
Journal of Magnetic Resonance. 306 (2019) - p. 118-123 , 2019

Link: https://doi.org/10.1016/..

3

Using rapid-scan EPR to improve the detection limit of quan..:

Möser, J. ; Lips, K. ; Tseytlin, M....
Journal of Magnetic Resonance. 281 (2017) - p. 17-25 , 2017

Link: https://doi.org/10.1016/..

4

Differences in expression of Wnt antagonist Dkk1 in healthy..:

RAY, S. ; KHASSAWNA, T. EL ; SOMMER, U....
Journal of Microscopy. 265 (2016) 1 - p. 111-120 , 2016

Link: https://doi.org/10.1111/..

5

Valence band offset in heterojunctions between crystalline ..:

Liebhaber, M. ; Mews, M. ; Schulze, T. F....
Applied Physics Letters. 106 (2015) 3 - p. , 2015

Link: https://doi.org/10.1063/..

6

Structural and electrical properties of metastable defects ..:

Melskens, J. ; Schnegg, A. ; Baldansuren, A....
Physical Review B. 91 (2015) 24 - p. , 2015

Link: https://doi.org/10.1103/..

7

CW and pulsed electrically detected magnetic resonance spec..:

Akhtar, W. ; Schnegg, A. ; Veber, S....
Journal of Magnetic Resonance. 257 (2015) - p. 94-101 , 2015

Link: https://doi.org/10.1016/..

8

Impact of dislocations and dangling bond defects on the ele..:

Steffens, S. ; Becker, C. ; Amkreutz, D....
Applied Physics Letters. 105 (2014) 2 - p. , 2014

Link: https://doi.org/10.1063/..

9

Metastable Defect Formation at Microvoids Identified as a S..:

Fehr, M. ; Schnegg, A. ; Rech, B....
Physical Review Letters. 112 (2014) 6 - p. , 2014

Link: https://doi.org/10.1103/..

10

Chemical interaction at the buried silicon/zinc oxide thin-..:

Wimmer, M. ; Gerlach, D. ; Wilks, R.G....
Journal of Electron Spectroscopy and Related Phenomena. 190 (2013) - p. 309-313 , 2013

Link: https://doi.org/10.1016/..

11

Atomic Structure of Interface States in Silicon Heterojunct..:

George, B. M. ; Behrends, J. ; Schnegg, A....
Physical Review Letters. 110 (2013) 13 - p. , 2013

Link: https://doi.org/10.1103/..

12

The silicon/zinc oxide interface in amorphous silicon-based..:

Gerlach, D. ; Wilks, R. G. ; Wippler, D....
Applied Physics Letters. 103 (2013) 2 - p. , 2013

Link: https://doi.org/10.1063/..

13

Influence of deep defects on device performance of thin-fil..:

Fehr, M. ; Simon, P. ; Sontheimer, T....
Applied Physics Letters. 101 (2012) 12 - p. , 2012

Link: https://doi.org/10.1063/..

14

Dangling bonds in amorphous silicon investigated by multifr..:

Fehr, M. ; Schnegg, A. ; Rech, B....
Journal of Non-Crystalline Solids. 358 (2012) 17 - p. 2067-2070 , 2012

Link: https://doi.org/10.1016/..

15

p-Type a-Si:H/ZnO:Al and µc-Si:H/ZnO:Al thin-film solar cel..:

, In: 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2,

Gerlach, D. ; Wippler, D. ; Wilks, R. G.... - p. 1-5 , 2012

Link: https://doi.org/10.1109/..