Liu, Binli
82  Ergebnisse:
Personensuche X
?
1

Evaluation on the electro-thermal instability process of th..:

Ma, Xiao ; Huang, Yongle ; Xiao, Fei...
Microelectronics Reliability.  154 (2024)  - p. 115339 , 2024
 
?
2

Lifetime Evaluation of IGBTs Under PWM by a Physical Iterat..:

, In: Lecture Notes in Electrical Engineering; The Proceedings of the 17th Annual Conference of China Electrotechnical Society,
Huang, Yongle ; Luo, Yifei ; Xiao, Fei.. - p. 1309-1319 , 2023
 
?
4

Modeling method for electrothermal cosimulation of high‐pow..:

Jia, Ying‐Jie ; Xiao, Fei ; Duan, Yao‐Qiang...
IEEJ Transactions on Electrical and Electronic Engineering.  14 (2019)  11 - p. 1711-1718 , 2019
 
?
5

Temperature monitoring inside IGBT modules at forward bias ..:

Huang, Yongle ; Luo, Yifei ; Xiao, Fei.
Microelectronics Reliability.  83 (2018)  - p. 187-197 , 2018
 
?
6

Simulation model and parameter extraction of Field-Stop (FS..:

Tang, Yong ; Wang, Bo ; Chen, Ming.
Microelectronics Reliability.  52 (2012)  12 - p. 2920-2931 , 2012
 
?
8

Physics of failure of die-attach joints in IGBTs under acce..:

Yongle, Huang ; Yifei, Luo ; Fei, Xiao..
Microelectronics Reliability.  109 (2020)  - p. 113637 , 2020
 
?
11

Family‐based genetic analysis in schizophrenia by whole‐exo..:

Shang, Binli ; Yang, Runxu ; Lian, Kun...
American Journal of Medical Genetics Part B: Neuropsychiatric Genetics.  195 (2024)  5 - p. , 2024
 
?
12

Enhancing antitumor immunity and achieving tumor eradicatio..:

ur Rehman, Adeel ; Wang, Zhihuai ; Qin, Qianshan...
International Immunopharmacology.  134 (2024)  - p. 112205 , 2024
 
?
15

Self-reduction of Mn4+ to Mn2+: NaY9Si6O26:Mn2+ red phospho..:

Wu, Sheng ; Hu, Shanshan ; Liu, Quan...
Journal of Materials Chemistry C.  11 (2023)  11 - p. 3865-3874 , 2023
 
1-15