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2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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Increased Fault Isolation Efficiency by Using Scan Cell Vis..:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
2
Integration of Soft Defect Localization (SDL) and Electro-O..:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
3
Test And Reliability Improvement With Defect-Image Classifi..:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
4
Recovered Scan Failure Investigation and Failure Mechanism ..:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
5
Novel Non-Destructive Physical Bitmap Verification Techniqu..:
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2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) ,
13
Signal and Power Integrity Design of Advanced Interface Bus..:
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2019 Electrical Design of Advanced Packaging and Systems (EDAPS) ,
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