Personensuche
X
?
2022 International Electron Devices Meeting (IEDM) ,
1
The Role of Interface Dynamics on the Reliability Performan..:
, In:
?
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
3
BEOL Integrated Ferroelectric HfO2 based Capacitors for FeR..:
, In:
?
2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF) ,
5
AFE-like Hysteresis Loops from Doped HfO2: Field Induced Ph..:
, In:
?
2019 IEEE International Electron Devices Meeting (IEDM) ,
6