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2022 IEEE Latin American Electron Devices Conference (LAEDC) ,
1
Parameter extraction in a 65nm nMOSFET technology from 300 ..:
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2020 17th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) ,
6
A Performance Comparative at Low Temperatures of Two FET Te..:
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2020 IEEE Latin America Electron Devices Conference (LAEDC) ,
7
Electrical and Thermal Characterization for SOI p-type FinF..:
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2020 IEEE Latin America Electron Devices Conference (LAEDC) ,
8
Stress- and Trap-Induced Body Fluctuations in 45nm SOI MOSF..:
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2019 14th Iberian Conference on Information Systems and Technologies (CISTI) ,
13