Lopez-L, O.
58  Ergebnisse:
Personensuche X
?
1

Parameter extraction in a 65nm nMOSFET technology from 300 ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Lopez-L, O. ; Martinez-R, I. ; Durini, D.... - p. 1-4 , 2022
 
?
6

A Performance Comparative at Low Temperatures of Two FET Te..:

, In: 2020 17th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE),
Lopez-L, Omar ; Martinez, I. ; Durini, D.... - p. 1-4 , 2020
 
?
7

Electrical and Thermal Characterization for SOI p-type FinF..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
 
?
8

Stress- and Trap-Induced Body Fluctuations in 45nm SOI MOSF..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
 
?
13

Quality Management System Based on the ISO 9001:2015: Study..:

, In: 2019 14th Iberian Conference on Information Systems and Technologies (CISTI),
 
?
14

Wing shape variations in an invasive moth are related to se..:

Hernández-L., N. ; Barragán, Á.R. ; Dupas, S...
Bulletin of Entomological Research.  100 (2010)  5 - p. 529-541 , 2010
 
?
 
1-15