E-LIB Suche - Ergebnisse für: Lou, Z W

1

The discrepancies in different facets of MgB2 bulk supercon..:

Zhang, J Y ; Zhang, Y F ; Lou, Z W...
Superconductor Science and Technology. 34 (2021) 4 - p. 045011 , 2021

Link: https://doi.org/10.1088/..

2

Effective heterogenization and catalytic use of active C5H5..:

Xu, Z. ; Lu, X.-H. ; Xia, Q.-H....
Catalysis Communications. 9 (2008) 8 - p. 1793-1798 , 2008

Link: https://doi.org/10.1016/..

3

A yield function for porous ductile materials:

Zuo, J.Z. ; Lou, Z.W. ; Kuang, Z.B.
Engineering Fracture Mechanics. 54 (1996) 4 - p. 589-591 , 1996

Link: https://doi.org/10.1016/..

4

Experimental investigation of fatigue behaviour for welded ..:

Cheng, Guangxu ; Kuang, Z.B. ; Lou, Z.W..
International Journal of Pressure Vessels and Piping. 67 (1996) 3 - p. 229-242 , 1996

Link: https://doi.org/10.1016/..

5

A yield function for porous ductile materials:

Zuo, J.Z. ; Lou, Z.W. ; Kuang, Z.B.
Engineering Fracture Mechanics. 53 (1996) 4 - p. 557-559 , 1996

Link: https://doi.org/10.1016/..

6

Elastoplastic boundary element analysis with Hetenyi's fund..:

Lou, Z.-W. ; Zhang, M.
Engineering Analysis with Boundary Elements. 10 (1992) 3 - p. 231-239 , 1992

Link: https://doi.org/10.1016/..

7

Ipr1 Gene Mediates RAW 264.7 Macrophage Cell Line Resistanc..:

He, X. N. ; Su, F. ; Lou, Z. Z....
Scandinavian Journal of Immunology. 74 (2011) 5 - p. 438-444 , 2011

Link: https://doi.org/10.1111/..

8

Parametric design of MEMS fuze safety release insurance mec..:

Zheng, F Q ; Lou, W Z ; Wang, F F.
Journal of Physics: Conference Series. 1209 (2019) - p. 012004 , 2019

Link: https://doi.org/10.1088/..

9

Predicting thermal comfort in Shanghai's non-air-conditione..:

Ji, X. L. ; Lou, W. Z. ; Dai, Z. Z...
Building Research & Information. 34 (2006) 5 - p. 507-514 , 2006

Link: https://doi.org/10.1080/..

10

Unleashing Endurance Limits of Emerging Memory: Multi-Level..:

Hsiang, K.-Y. ; Chang, F.-S. ; Lou, Z.-F....
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2708-2713 , 2024

Link: https://doi.org/10.1109/..

11

Cryogenic Endurance of Anti-ferroelectric and Ferroelectric..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Hsiang, K.-Y. ; Lee, J.-Y. ; Lou, Z.-F.... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

12

FeRAM Recovery up to 200 Periods with Accumulated Endurance..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),

Hsiang, K.-Y. ; Lee, J.-Y. ; Chang, F.-S.... - p. 1-2 , 2023

Link: https://doi.org/10.23919..

13

Fatigue Mechanism of Antiferroelectric Hf0.1Zr0.9O2 Toward ..:

Hsiang, K.-Y. ; Lee, J.-Y. ; Lou, Z.-F....
IEEE Transactions on Electron Devices. 70 (2023) 4 - p. 2142-2146 , 2023

Link: https://doi.org/10.1109/..

14

Superlattice HfO2-ZrO2 based Ferro-Stack HfZrO2 FeFETs: Hom..:

, In: 2022 International Electron Devices Meeting (IEDM),

Liao, C.-Y. ; Lou, Z.-F. ; Lin, C.-Y.... - p. 36.6.1-36.6.4 , 2022

Link: https://doi.org/10.1109/..

15

Dual-Mode GaN MOS-HEMT of Cascode Configuration with Si Fer..:

, In: 2022 IEEE Silicon Nanoelectronics Workshop (SNW),

Liao, C.-Y. ; Hsiang, K.-Y. ; Lou, Z.-F.... - p. 1-2 , 2022

Link: https://doi.org/10.1109/..