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2023 IEEE International Test Conference in Asia (ITC-Asia) ,
1
Integrated Progressive Built-In Self-Repair (IPBISR) Techni..:
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2023 IEEE CPMT Symposium Japan (ICSJ) ,
3
A DfT Technique for Electrical Interconnect Testing of Circ..:
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2022 IEEE International Test Conference in Asia (ITC-Asia) ,
4
Effective Switching Probability Calculation to Locate Hotsp..:
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2022 IEEE International Test Conference in Asia (ITC-Asia) ,
5
Fault Resilience Techniques for Flash Memory of DNN Acceler..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
6
Enhanced Interconnect Test Method for Resistive Open Defect..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
7
Fault Securing Techniques for Yield and Reliability Enhance..:
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2022 IEEE International Test Conference (ITC) ,
8
Fine-Grained Built-In Self-Repair Techniques for NAND Flash..:
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2022 IEEE CPMT Symposium Japan (ICSJ) ,
9
Detectability of Open Defects at Interconnects between Dies..:
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2022 IEEE International Test Conference (ITC) ,
10
Fault Resilience Techniques for Flash Memory of DNN Acceler..:
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2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ,
12
Fault-Aware ECC Techniques for Reliability Enhancement of F..:
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2020 IEEE International Test Conference in Asia (ITC-Asia) ,
13