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2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
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Common Source Line-to-Word Line Short Improvement by Elimin..:
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2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
10
Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio..:
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2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
11
Improvement of Twisting and Line-Edge Roughness of 3D NAND ..:
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2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
13