E-LIB Suche - Ergebnisse für: Lubenchenko, O I

1

Numerical Simulation of Photoelectric Emission from a Nano-..:

Lukiantsev, D. S. ; Lubenchenko, A. V. ; Ivanov, D. A....
Physics of Atomic Nuclei. 86 (2023) 10 - p. 2344-2351 , 2023

2

Controlled Ultra-Thin Suboxide Films Generation in Metal-Ox..:

Lubenchenko, A V ; Lukyantsev, D S ; Pavolotsky, A B...
Journal of Physics: Conference Series. 1695 (2020) 1 - p. 012025 , 2020

Link: https://doi.org/10.1088/..

3

ThinFilmsAnalysisMPEI – Software for XPS Analysis of Multil..:

Lubenchenko, A V ; Lubenchenko, O I ; Ivanov, D A.
Journal of Physics: Conference Series. 1683 (2020) 3 - p. 032014 , 2020

Link: https://doi.org/10.1088/..

4

Non-destructive chemical and phase layer profiling of multi..:

Lubenchenko, A V ; Ivanov, D A ; Lubenchenko, O I...
Journal of Physics: Conference Series. 1370 (2019) 1 - p. 012048 , 2019

Link: https://doi.org/10.1088/..

5

Formation of inelastic scattered background photoelectrons,..:

Lubenchenko, A V ; Ivanov, D A ; Lubenchenko, O I.
Journal of Physics: Conference Series. 1370 (2019) 1 - p. 012049 , 2019

Link: https://doi.org/10.1088/..

6

Interface Layers of Niobium Nitride Thin Films:

Lubenchenko, A V ; Iachuk, V A ; Krause, S...
Journal of Physics: Conference Series. 1410 (2019) 1 - p. 012124 , 2019

Link: https://doi.org/10.1088/..

7

Air-Oxidation of Nb Nano-Films:

Lubenchenko, A. V. ; Batrakov, A. A. ; Ivanov, D. A....
Semiconductors. 52 (2018) 5 - p. 678-682 , 2018

Link: https://doi.org/10.1134/..

8

XPS Study of Niobium and Niobium-Nitride Nanofilms:

Lubenchenko, A. V. ; Batrakov, A. A. ; Shurkaeva, I. V....
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 12 (2018) 4 - p. 692-700 , 2018

Link: https://doi.org/10.1134/..

9

XPS Depth Profiling of Air-Oxidized Nanofilms of NbN on GaN..:

Lubenchenko, A.V. ; Batrakov, A.A. ; Krause, S....
Journal of Physics: Conference Series. 917 (2017) - p. 092001 , 2017

Link: https://doi.org/10.1088/..

10

Modern methods of transfer theory used for solution of sign..:

Afanas'ev, V.P. ; Kaplya, P.S. ; Lubenchenko, A.V..
Vacuum. 105 (2014) - p. 96-101 , 2014

Link: https://doi.org/10.1016/..

11

An XPS method for layer profiling of NbN thin films:

Lubenchenko A.V ; Batrakov A.A ; Pavolotsky A.B...
http://dx.doi.org/10.1051/epjconf/201713203053. , 2017

Link: https://doi.org/10.1051/..

12

Website XPS.mpei.ru: a Tool for XPS Analysis of Solid Surfa..:

, In: 2024 7th International Conference on Information Technologies in Engineering Education (Inforino),

Lubenchenko, Alexandr V. ; Lubenchenko, Olga I. ; Ivanov, Dmitry A... - p. 1-4 , 2024

Link: https://doi.org/10.1109/..

13

New Standards of Quality Management in Audit. The Risk-Base..:

Lubenchenko, O. E. ; Shulha, S. V. ; Korinko, M. D.
Statistics of Ukraine. 96 (2022) 1 - p. 117-126 , 2022

Link: https://doi.org/10.31767..

14

XPS Study of Air-Oxidized Chrome Thin Films:

, In: 2020 International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE),

Lubenchenko, Alexandr V. ; Iachuk, Vladimir A. ; Lubenchenko, Olga I.... - p. 1-4 , 2020

Link: https://doi.org/10.1109/..

15

Acceleration of Monte Carlo Simulation of Electron Transpor:

, In: 2020 V International Conference on Information Technologies in Engineering Education ( Inforino ),

Lubenchenko, Alexandr V. ; Lubenchenko, Olga I. ; Ivanov, Dmitry A.... - p. 1-4 , 2020

Link: https://doi.org/10.1109/..