Korsunsky, AM ; Salvati, E ; Lunt, AGJ...
Korsunsky , AM , Salvati , E , Lunt , AGJ , Sui , T , Mughal , MZ , Daniel , R , Keckes , J , Bemporad , E & Sebastiani , M 2018 , ' Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis ' , Materials & Design , vol. 145 , pp. 55-64 . https://doi.org/10.1016/j.matdes.2018.02.044.  , 2018