Luo, Yuan-Chun
16013  Ergebnisse:
Personensuche X
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1

A Cross-layer Framework for Design Space and Variation Anal..:

, In: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC),
Luo, Yuan-Chun ; Read, James ; Lu, Anni. - p. 159-164 , 2024
 
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2

Endurance-Aware Compiler for 3-D Stackable FeRAM as Global ..:

Luo, Yuan-Chun ; Lu, Anni ; Luo, Yandong...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  , 2024
 
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3

A Dynamic Power-Only Compute-in-Memory Macro With Power-of-..:

Yeo, Injune ; He, Wangxin ; Luo, Yuan-Chun..
IEEE Solid-State Circuits Letters.  7 (2024)  - p. 70-73 , 2024
 
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4

Engineering nvCap From FEOL to BEOL with Ferroelectric Smal..:

, In: 2024 IEEE International Memory Workshop (IMW),
 
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6

Correlated Oxide Selector for Cross-Point Embedded Non-Vola..:

Luo, Yuan-Chun ; Khanna, Abhishek ; Grisafe, Benjamin...
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 916-921 , 2024
 
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7

Corrections to "A Dynamic Power-Only Compute-in-Memory Macr..:

Yeo, Injune ; He, Wangxin ; Luo, Yuan-Chun..
IEEE Solid-State Circuits Letters.  7 (2024)  - p. 110-110 , 2024
 
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8

Tunable Non-Volatile Gate-to-Source/Drain Capacitance of Fe..:

Kim, Tae-Hyeon ; Phadke, Omkar ; Luo, Yuan-Chun...
IEEE Electron Device Letters.  44 (2023)  10 - p. 1628-1631 , 2023
 
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9

Scalable In-Memory Clustered Annealer With Temporal Noise o..:

Lu, Anni ; Hur, Jae ; Luo, Yuan-Chun...
IEEE Journal on Emerging and Selected Topics in Circuits and Systems.  13 (2023)  1 - p. 422-435 , 2023
 
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10

Low-Frequency Noise Characteristics of Ferroelectric Field-..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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11

3-D Heterogeneous Integration of RRAM-Based Compute-In-Memo..:

Kaul, Ankit ; Luo, Yandong ; Peng, Xiaochen...
IEEE Transactions on Electron Devices.  70 (2023)  2 - p. 485-492 , 2023
 
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13

Design and Optimization of Non-Volatile Capacitive Crossbar..:

Luo, Yuan-Chun ; Lu, Anni ; Hur, Jae..
IEEE Transactions on Circuits and Systems II: Express Briefs.  69 (2022)  3 - p. 784-788 , 2022
 
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14

A Technology Path for Scaling Embedded FeRAM to 28 nm and B..:

Luo, Yuan-Chun ; Hur, Jae ; Wang, Zheng...
IEEE Transactions on Electron Devices.  69 (2022)  1 - p. 109-114 , 2022
 
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15

Scalable In-Memory Clustered Annealer with Temporal Noise o..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lu, Anni ; Hur, Jae ; Luo, Yuan-Chun... - p. 22.5.1-22.5.4 , 2022
 
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