E-LIB Suche - Ergebnisse für: Lv, Chengkan

1

Diversified and Multi-Class Controllable Industrial Defect ..:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),

Wei, Jing ; Shen, Fei ; Lv, Chengkan... - p. 4445-4453 , 2023

Link: https://doi.org/10.1109/..

2

Unsupervised Automatic Defect Inspection based on Image Mat..:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),

Lv, Chengkan ; Zhang, Zhengtao ; Shen, Fei. - p. 4435-4444 , 2023

Link: https://doi.org/10.1109/..

3

Dual-Branch Learning With Prior Information for Surface Ano..:

Wang, Shuyuan ; Lv, Chengkan ; Zhang, Zhengtao.
IEEE Transactions on Instrumentation and Measurement. 72 (2023) - p. 1-11 , 2023

Link: https://doi.org/10.1109/..

4

Mask-Guided Generation Method for Industrial Defect Images ..:

Wei, Jing ; Zhang, Zhengtao ; Shen, Fei.
Machines. 10 (2022) 12 - p. 1239 , 2022

Link: https://doi.org/10.3390/..

5

Patterned Fabric Defect Detection Based on Double-branch Pa..:

, In: 2021 China Automation Congress (CAC),

Wang, Shaohu ; Lv, Chengkan ; Wang, ShuYuan.. - p. 3798-3803 , 2021

Link: https://doi.org/10.1109/..

6

A Brief Research and Lookback of the Development of Iris Re..:

, In: 2019 IEEE International Conference on Service Operations and Logistics, and Informatics (SOLI),

Li, Xiaoshuang ; Hu, Shenhua ; Lv, Chengkan... - p. 140-145 , 2019

Link: https://doi.org/10.1109/..

7

A Fast Surface Defect Detection Method Based on Background ..:

Lv, Chengkan ; Zhang, Zhengtao ; Shen, Fei..
International Journal of Precision Engineering and Manufacturing. 21 (2019) 3 - p. 363-375 , 2019

Link: https://doi.org/10.1007/..

8

Produce Once, Utilize Twice for Anomaly Detection:

Wang, Shuyuan ; Li, Qi ; Luo, Huiyuan..
http://arxiv.org/abs/2312.12913. , 2023

Link: http://arxiv.org/abs/231..

9

The Second-place Solution for CVPR VISION 23 Challenge Trac..:

Tao, Xian ; Qu, Zhen ; Luo, Hengliang...
http://arxiv.org/abs/2306.14116. , 2023

Link: http://arxiv.org/abs/230..

10

A set of anomaly detection papers (2019-2021):

chengkan lv ; zhengtao zhang ; fei shen.
http://www.doi.org/10.16383/j.aas.c200956. , 2023

Link: https://doi.org/10.57760..

11

Mask-Guided Generation Method for Industrial Defect Images ..:

Jing Wei ; Zhengtao Zhang ; Fei Shen.
Advanced Manufacturing. , 2022

Link: https://doi.org/10.3390/..

12

Mask-Guided Generation Method for Industrial Defect Images ..:

Jing Wei ; Zhengtao Zhang ; Fei Shen.
https://www.mdpi.com/2075-1702/10/12/1239. , 2022

Link: https://doi.org/10.3390/..