E-LIB Suche - Ergebnisse für: Lysaght, Pat - Sprache DE

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1

Investigation of the thermal stability of Mo-In0.45Ga0.47As..:

Walsh, Lee A. ; Weiland, Conan ; McCoy, Anthony P....
Journal of Applied Physics. 120 (2016) 13 - p. , 2016

Link: https://doi.org/10.1063/..

2

Ni-(In,Ga)As Alloy Formation Investigated by Hard-X-Ray Pho..:

Walsh, Lee A. ; Hughes, Greg ; Weiland, Conan...
Physical Review Applied. 2 (2014) 6 - p. , 2014

Link: https://doi.org/10.1103/..

3

The Application of X-ray Metrology for Rapid Development of..:

Hung, Pui Yee ; Böscke, Tim ; Wormington, Matthew...
ECS Transactions. 16 (2008) 5 - p. 149-152 , 2008

Link: https://doi.org/10.1149/..

4

Intrinsic Electronically Active Defects in Transition Metal..:

Lucovsky, Gerald ; Seo, Hyungtak ; Lee, Sanghyun...
Japanese Journal of Applied Physics. 46 (2007) 4S - p. 1899 , 2007

Link: https://doi.org/10.1143/..

5

Nickel-silicide phase effects on flatband voltage shift and..:

Kang, Chang Yong ; Lysaght, Pat ; Choi, Rino...
Applied Physics Letters. 86 (2005) 22 - p. , 2005

Link: https://doi.org/10.1063/..

6

Interfacial Roughness of HfxSi1-xO2 High-k films by TEM and..:

Foran, Brendan ; Gondran, Carolyn ; Lysaght, Pat
Microscopy and Microanalysis. 9 (2003) S02 - p. 458-459 , 2003

Link: https://doi.org/10.1017/..

7

LETTERS:

SULLIVAN, MARY ; MOLONEY, TADHG ; LYSAGHT, O'CONNOR...
History Ireland. 25 (2017) 3 - p. 12-15 , 2017

Link: https://www.jstor.org/st..

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