E-LIB Suche - Ergebnisse für: M. Jevtic

1

Simultaneous mechanical and electrical straining of convent..:

Stanimirović, Z. ; Jevtić, M.M. ; Stanimirović, I.
Microelectronics Reliability. 48 (2008) 1 - p. 59-67 , 2008

Link: https://doi.org/10.1016/..

2

Impact of bias condition on 1/f noise of dual-gate depletio..:

Videnovic-Misic, M. ; Jevtic, M.M.
Microelectronics Reliability. 48 (2008) 7 - p. 1008-1014 , 2008

Link: https://doi.org/10.1016/..

3

Multiple high-voltage pulse stressing of conventional thick..:

Stanimirović, I. ; Jevtić, M.M. ; Stanimirović, Z.
Microelectronics Reliability. 47 (2007) 12 - p. 2242-2248 , 2007

Link: https://doi.org/10.1016/..

4

High-voltage pulse stressing of thick-film resistors and no..:

Stanimirović, I. ; Jevtić, M.M. ; Stanimirović, Z.
Microelectronics Reliability. 43 (2003) 6 - p. 905-911 , 2003

Link: https://doi.org/10.1016/..

5

Evaluation of thick-film resistor structural parameters bas..:

Jevtić, M.M ; Stanimirović, Z ; Stanimirović, I
Microelectronics Reliability. 41 (2001) 1 - p. 59-66 , 2001

Link: https://doi.org/10.1016/..

6

Thick-film resistor quality indicator based on noise index ..:

Jevtić, M.M. ; Mrak, I. ; Stanimirović, Z.
Microelectronics Journal. 30 (1999) 12 - p. 1255-1259 , 1999

Link: https://doi.org/10.1016/..

7

Anomalous I–V and pulse noise in reverse biased p–n junctio..:

Jevtić, M.M
Microelectronics Reliability. 38 (1998) 3 - p. 337-343 , 1998

Link: https://doi.org/10.1016/..

8

Low-frequency noise in thick-film structures caused by trap..:

Mrak, I. ; Jevtić, M.M. ; Stanimirović, Z.
Microelectronics Reliability. 38 (1998) 10 - p. 1569-1576 , 1998

Link: https://doi.org/10.1016/..

9

Two-polarity pulse noise in reverse biased degraded p–n jun..:

Jevtić, M.M.
Microelectronics Reliability. 38 (1998) 10 - p. 1631-1637 , 1998

Link: https://doi.org/10.1016/..

10

Self consistent fitting method for defect analysis by low-f..:

Jevtić, M.M ; Lazović, M.V
Solid-State Electronics. 41 (1997) 8 - p. 1127-1131 , 1997

Link: https://doi.org/10.1016/..

11

Electronic component reliability fundamentals, modelling, e..:

Jevtic, M.M.
Microelectronics Reliability. 37 (1997) 6 - p. 975 , 1997

Link: https://doi.org/10.1016/..

12

Integrating reliability into microelectronics manufacturing:

Chritou, Aris ; Jevtić, M.M.
Microelectronics Reliability. 37 (1997) 5 - p. 874 , 1997

Link: https://doi.org/10.1016/..

13

Quality conformance and qualification of microelectronic pa..:

Pecht, Michael ; Dasgupta, Abhijit ; Evans, John W...
Microelectronics Reliability. 37 (1997) 5 - p. 873-874 , 1997

Link: https://doi.org/10.1016/..

14

Noise as a diagnostic and prediction tool in reliability ph..:

Jevtić, M.M.
Microelectronics Reliability. 35 (1995) 3 - p. 455-477 , 1995

Link: https://doi.org/10.1016/..

15

Infrared plasma reflectivity minimum in heavily doped n-Si:

Jevtić, M.M. ; Živanov, M.B.
Infrared Physics. 34 (1993) 1 - p. 75-81 , 1993

Link: https://doi.org/10.1016/..