Mahoney, Christine M.
~ 1400  Ergebnisse:
Personensuche X
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1

O2 vs. Ar Gas Cluster Ion Beam Sources for ToF-SIMS Depth P..:

Mahoney, Christine M ; Fahey, Albert J ; Adib, Kaveh..
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 751-752 , 2023
 
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4

Molecular Depth Profiling with Cluster Ion Beams:

, In: Cluster Secondary Ion Mass Spectrometry,
Mahoney, Christine M. ; Wucher, Andreas - p. 117-205 , 2013
 
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8

Cluster SIMS depth profiling of stereo‐specific PMMA thin f..:

Mahoney, Christine M.
Surface and Interface Analysis.  42 (2010)  8 - p. 1393-1401 , 2010
 
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9

Microstructure and Elution of Tetracycline from Block Copol..:

Mcdermott, Martin K. ; Saylor, David M. ; Casas, Rachel...
Journal of Pharmaceutical Sciences.  99 (2010)  6 - p. 2777-2785 , 2010
 
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13

Cluster secondary ion mass spectrometry of polymers and rel..:

Mahoney, Christine M.
Mass Spectrometry Reviews.  29 (2009)  2 - p. 247-293 , 2009
 
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