Maier-Flaig, Hannes
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Automatic Parameter Extraction of MOSFET Compact Models usi..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Alia, Gazmend ; Buzo, Andi ; Maier-Flaig, Hannes... - p. 94-96 , 2022
 
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