E-LIB Suche - Ergebnisse für: Maillard, Pierre

1

Radiation-Tolerant Deep Learning Processor Unit (DPU)-Based..:

Maillard, Pierre ; Chen, Yanran P. ; Vidmar, Jason...
IEEE Transactions on Nuclear Science. 70 (2023) 4 - p. 714-721 , 2023

Link: https://doi.org/10.1109/..

2

Heavy-Ion and Proton Evaluation of AMD 7nm Versal™ Multicor..:

, In: 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC),

Maillard, Pierre ; Chen, Yanran P. ; Arver, Jue... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

3

64MeV Proton single-event evaluation of Xilinx Single Event..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),

Chen, Yanran Paula ; Maillard, Pierre ; Veggalam, Rama Devi... - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

4

Neutron and 64MeV Proton Characterization of Xilinx 7nm Ver..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),

Maillard, Pierre ; Chen, Y. Paula ; Arver, Jue... - p. 1-5 , 2022

Link: https://doi.org/10.1109/..

5

Heavy-ion and proton characterization of AMD 7nm Versal™ mu..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Maillard, Pierre ; Chen, Yanran P. ; Arver, Jue... - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

6

7nm FinFET technology heavy ion SEL evaluation using Xilinx..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Dufour, Arnaud ; Carron, Jerome ; Pierron, Francois... - p. 1-6 , 2021

Link: https://doi.org/10.1109/..

7

Evaluation of ISO 26262 and IEC 61508 metrics for transient..:

Ballan, Oscar ; Maillard, Pierre ; Arver, Jue...
Microelectronics Reliability. 107 (2020) - p. 113601 , 2020

Link: https://doi.org/10.1016/..

8

Single-event Evaluation of Xilinx 16nm UltraScale+™ High-Ba..:

, In: 2019 IEEE Radiation Effects Data Workshop,

Chen, Yanran P. ; Maillard, Pierre ; Barton, Jeff... - p. 1-5 , 2019

Link: https://doi.org/10.1109/..

9

Total Ionizing Dose and Single-Events characterization of X..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Maillard, Pierre ; Barton, Jeff ; Hart, Michael J... - p. 1-6 , 2019

Link: https://doi.org/10.1109/..

10

Neutron, 64 MeV Proton & Alpha Single-event Characterizatio..:

, In: 2017 IEEE Radiation Effects Data Workshop (REDW),

Maillard, Pierre ; Hart, Michael ; Barton, Jeff.. - p. 1-5 , 2017

Link: https://doi.org/10.1109/..

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