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Mamy Randriamihaja, Yoann
7  Ergebnisse:
Personensuche X
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1

Bias-Induced Healing of $V_{\text {min}}$ Failures in Advan..:

Mann, Randy W. ; McMahon, William ; Mamy Randriamihaja, Yoann...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  25 (2017)  2 - p. 660-669 , 2017
Link: https://doi.org/10.1109/..
 
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2

Microscopic scale characterization and modeling of transist..:

Mamy Randriamihaja, Yoann ; Huard, V. ; Federspiel, X....
Microelectronics Reliability.  52 (2012)  11 - p. 2513-2520 , 2012
Link: https://doi.org/10.1016/..
 
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3

Analysis of defect capture cross sections using non-radiati..:

Garetto, Davide ; Randriamihaja, Yoann Mamy ; Zaka, Alban...
Solid-State Electronics.  71 (2012)  - p. 74-79 , 2012
Link: https://doi.org/10.1016/..
 
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4

Comparing defect characterization techniques with non-radia..:

Garetto, Davide ; Randriamihaja, Yoann Mamy ; Rideau, Denis..
Journal of Computational Electronics.  11 (2012)  3 - p. 225-237 , 2012
Link: https://doi.org/10.1007/..
 
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5

Etude de la fiabilité des technologies CMOS avancées, depui..:

Mamy Randriamihaja, Yoann
http://www.theses.fr/2012AIXM4781/document.  , 2012
Link: http://www.theses.fr/201..
 
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6

From defects creation to circuit reliability – A bottom-up ..:

Huard, V. ; Cacho, F. ; Mamy Randriamihaja, Y..
Microelectronic Engineering.  88 (2011)  7 - p. 1396-1407 , 2011
Link: https://doi.org/10.1016/..
 
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7

New Hot Carrier degradation modeling reconsidering the role..:

, In: 2013 IEEE International Reliability Physics Symposium (IRPS),
Randriamihaja, Y. Mamy ; Federspiel, X. ; Huard, V... - p. XT.1.1-XT.1.5 , 2013
Link: https://doi.org/10.1109/..
 
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