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2023 IEEE East-West Design & Test Symposium (EWDTS) ,
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A Power Supply Rejection Based Approach for Robust Defect D..:
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2023 IEEE East-West Design & Test Symposium (EWDTS) ,
3
Graph Theory Based Defect Simulation Framework for Analog a..:
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2023 IEEE East-West Design & Test Symposium (EWDTS) ,
4
Systematic Methodology to Design High Precision Voltage Ref..:
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2023 IEEE East-West Design & Test Symposium (EWDTS) ,
5
Digital Assisted Defect Detection Methods for Analog and Mi..:
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2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
7
All Digital Low-Cost Built-in Defect Testing Strategy for O..:
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2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI) ,
8
Digital Defect-Oriented Test Methodology for Flipped Voltag..:
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2022 IEEE 40th VLSI Test Symposium (VTS) ,
9
All Digital Low-Overhead SAR ADC Built-In Self-Test for Fau..:
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2022 IEEE International Symposium on Circuits and Systems (ISCAS) ,
10
Robust Built-in Defect-Detection for Low Drop-Out Regulator..:
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2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI) ,
11
A Time-Efficient Defect Simulation Framework for Analog and..:
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2022 IEEE International Symposium on Circuits and Systems (ISCAS) ,
12
A Wide-Range Low-cost Temperature to Digital Converter Inde..:
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2020 IEEE International Test Conference (ITC) ,
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