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Marampally Saikiran
13  Ergebnisse:
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1

Operational Amplifiers Defect Detection and Localization Us..:

Sekyere, Michael ; Saikiran, Marampally ; Chen, Degang
Electronics.  13 (2024)  14 - p. 2871 , 2024
Link: https://doi.org/10.3390/..
 
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2

A Power Supply Rejection Based Approach for Robust Defect D..:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
Sekyere, Michael ; Saikiran, Marampally ; Chen, Degang - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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3

Graph Theory Based Defect Simulation Framework for Analog a..:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
Saikiran, Marampally ; Sekyere, Michael ; Ganji, Mona. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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4

Systematic Methodology to Design High Precision Voltage Ref..:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
Naganadhan, Vijayalakshmi ; Saikiran, Marampally ; Gshash, Mahmoud. - p. 1-11 , 2023
Link: https://doi.org/10.1109/..
 
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5

Digital Assisted Defect Detection Methods for Analog and Mi..:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
Saikiran, Marampally ; Sekyere, Michael ; Ganji, Mona. - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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6

Low-cost defect simulation framework for analog and mixed s..:

Saikiran, Marampally ; Sekyere, Michael ; Ganji, Mona..
Analog Integrated Circuits and Signal Processing.  117 (2023)  1-3 - p. 73-94 , 2023
Link: https://doi.org/10.1007/..
 
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7

All Digital Low-Cost Built-in Defect Testing Strategy for O..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Sekyere, Michael ; Saikiran, Marampally ; Chen, Degang - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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8

Digital Defect-Oriented Test Methodology for Flipped Voltag..:

, In: 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI),
Saikiran, Marampally ; Ganji, Mona ; Chen, Degang - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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9

All Digital Low-Overhead SAR ADC Built-In Self-Test for Fau..:

, In: 2022 IEEE 40th VLSI Test Symposium (VTS),
Ganji, Mona ; Saikiran, Marampally ; Chen, Degang - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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10

Robust Built-in Defect-Detection for Low Drop-Out Regulator..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Saikiran, Marampally ; Ganji, Mona ; Chen, Degang - p. 1580-1584 , 2022
Link: https://doi.org/10.1109/..
 
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11

A Time-Efficient Defect Simulation Framework for Analog and..:

, In: 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI),
Saikiran, Marampally ; Ganji, Mona ; Chen, Degang - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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12

A Wide-Range Low-cost Temperature to Digital Converter Inde..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Ganji, Mona ; Saikiran, Marampally ; Chen, Degang - p. 605-609 , 2022
Link: https://doi.org/10.1109/..
 
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13

Robust DfT Techniques for Built-in Fault Detection in Opera..:

, In: 2020 IEEE International Test Conference (ITC),
Saikiran, Marampally ; Ganji, Mona ; Chen, Degang - p. 1-10 , 2020
Link: https://doi.org/10.1109/..
 
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