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Marcelot, Olivier
57  Ergebnisse:
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1

Limitations and drawbacks of DQE estimation methods applied..:

Marcelot, Olivier ; Marcelot, Cécile ; Rolando, Sébastien
Microscopy.  , 2024
Link: https://doi.org/10.1093/..
 
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2

Analysis methodology of Deep Trench Isolation Field-Effect ..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Tlemsani, Samuel ; Ricq, Stephane ; Marcelot, Olivier. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Development of a Charge-Multiplication CMOS Image Sensor Ba..:

Marcelot, Olivier ; Morvan, Marjorie ; Salih Alj, Antoine...
Sensors.  23 (2023)  23 - p. 9518 , 2023
Link: https://doi.org/10.3390/..
 
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4

Modeling, Simulation Methods and Characterization of Photon..:

Panglosse, Aymeric ; Martin-Gonthier, Philippe ; Marcelot, Olivier...
Sensors.  21 (2021)  17 - p. 5860 , 2021
Link: https://doi.org/10.3390/..
 
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5

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
Sensors.  20 (2020)  1 - p. 287 , 2020
Link: https://doi.org/10.3390/..
 
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6

Dark Count Rate Modeling in Single-Photon Avalanche Diodes ..:

, In: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS),
Panglosse, Aymeric ; Martin-Gonthier, Philippe ; Marcelot, Olivier... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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7

Leakage Current Non-Uniformity and Random Telegraph Signals..:

Le Roch, Alexandre ; Goiffon, Vincent ; Marcelot, Olivier...
Sensors.  19 (2019)  24 - p. 5550 , 2019
Link: https://doi.org/10.3390/..
 
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8

An Efficient Method for Modeling Parasitic Light Sensitivit..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Pace, Federico ; Marcelot, Olivier ; Martin-Gonthier, Philippe... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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9

Study of silicon–germanium interdiffusion from pure germani..:

Gavelle, Mathieu ; Bazizi, El Mehdi ; Scheid, Emmanuel...
Materials Science and Engineering: B.  154-155 (2008)  - p. 110-113 , 2008
Link: https://doi.org/10.1016/..
 
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10

Detection of Cs2Ge+ clusters for the quantification of germ..:

Gavelle, Mathieu ; Scheid, Emmanuel ; Cristiano, Fuccio...
Journal of Applied Physics.  102 (2007)  7 - p. , 2007
Link: https://doi.org/10.1063/..
 
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11

Crystal Damage Removal by Spike and Flash Annealing:

Lerch, Wilfried ; Paul, Silke ; Niess, Juergen...
ECS Transactions.  3 (2006)  2 - p. 77-84 , 2006
Link: https://doi.org/10.1149/..
 
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12

Modeling, Simulation Methods and Characterization of Photon..:

Panglosse, Aymeric ; Martin-Gonthier, Philippe ; Marcelot, Olivier...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8434308/.  , 2021
Link: http://www.ncbi.nlm.nih...
 
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13

High Displacement Damage Dose Effects in Radiation Hardened..:

Rizzolo, Serena ; Le Roch, Alexandre ; Marcelot, Olivier...
https://oatao.univ-toulouse.fr/26853/1/Rizzolo_26853.pdf.  , 2020
Link: https://oatao.univ-toulo..
 
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14

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
https://oatao.univ-toulouse.fr/26913/1/Doyen_26913.pdf.  , 2020
Link: https://oatao.univ-toulo..
 
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15

Dark Count Rate Modeling in Single-Photon Avalanche Diodes:

Panglosse, Aymeric ; Martin-Gonthier, Philippe ; Marcelot, Olivier...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCSI.2020.2971108.  , 2020
Link: https://hal.archives-ouv..
 
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