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X
Markunas, J.K.
58  Ergebnisse:
Personensuche X
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1

Impact of CdZnTe Substrates on MBE HgCdTe Deposition:

Benson, J. D. ; Bubulac, L. O. ; Jaime-Vasquez, M....
Journal of Electronic Materials.  46 (2017)  9 - p. 5418-5423 , 2017
Link: https://doi.org/10.1007/..
 
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2

Analysis of Etched CdZnTe Substrates:

Benson, J. D. ; Bubulac, L. O. ; Jaime-Vasquez, M....
Journal of Electronic Materials.  45 (2016)  9 - p. 4502-4510 , 2016
Link: https://doi.org/10.1007/..
 
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3

As-Received CdZnTe Substrate Contamination:

Benson, J. D. ; Bubulac, L. O. ; Jaime-Vasquez, M....
Journal of Electronic Materials.  44 (2015)  9 - p. 3082-3091 , 2015
Link: https://doi.org/10.1007/..
 
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4

Impact of Tellurium Precipitates in CdZnTe Substrates on MB..:

Benson, J. D. ; Bubulac, L. O. ; Smith, P. J....
Journal of Electronic Materials.  43 (2014)  11 - p. 3993-3998 , 2014
Link: https://doi.org/10.1007/..
 
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5

The Surface Kinetics of MBE-Grown CdTe (211)B During In Sit..:

Lennon, C. M. ; Almeida, L. A. ; Jacobs, R. N....
Journal of Electronic Materials.  42 (2013)  11 - p. 3344-3348 , 2013
Link: https://doi.org/10.1007/..
 
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6

Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrat..:

Benson, J. D. ; Bubulac, L. O. ; Lennon, C. M....
Journal of Electronic Materials.  42 (2013)  11 - p. 3217-3223 , 2013
Link: https://doi.org/10.1007/..
 
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7

Growth and Analysis of HgCdTe on Alternate Substrates:

Benson, J.D. ; Bubulac, L.O. ; Smith, P.J....
Journal of Electronic Materials.  41 (2012)  10 - p. 2971-2974 , 2012
Link: https://doi.org/10.1007/..
 
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8

Development of MBE II–VI Epilayers on GaAs(211)B:

Jacobs, R.N. ; Nozaki, C. ; Almeida, L.A....
Journal of Electronic Materials.  41 (2012)  10 - p. 2707-2713 , 2012
Link: https://doi.org/10.1007/..
 
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9

Real-Time In Situ Monitoring of GaAs (211) Oxide Desorption..:

Lennon, C.M. ; Almeida, L.A. ; Jacobs, R.N....
Journal of Electronic Materials.  41 (2012)  10 - p. 2965-2970 , 2012
Link: https://doi.org/10.1007/..
 
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10

High-Quality (211)B CdTe on (211)Si Substrates Using Metalo..:

Rao, S. R. ; Shintri, S. S. ; Markunas, J. K...
Journal of Electronic Materials.  40 (2011)  8 - p. 1790-1794 , 2011
Link: https://doi.org/10.1007/..
 
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11

Dislocation Analysis in (112)B HgCdTe/CdTe/Si:

Benson, J. D. ; Farrell, S. ; Brill, G....
Journal of Electronic Materials.  40 (2011)  8 - p. 1847-1853 , 2011
Link: https://doi.org/10.1007/..
 
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12

Si Wafer Thinning Techniques Compatible With Epitaxy of CdT..:

Markunas, J. K. ; Jacobs, R. N. ; Smith, P. J..
Journal of Electronic Materials.  40 (2011)  8 - p. 1809-1814 , 2011
Link: https://doi.org/10.1007/..
 
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13

X-ray Diffraction Imaging of Improved Bulk-Grown CdZnTe(211..:

Markunas, J. K. ; Almeida, L. A. ; Jacobs, R. N....
Journal of Electronic Materials.  39 (2010)  6 - p. 738-742 , 2010
Link: https://doi.org/10.1007/..
 
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14

Feasibility of Localized Substrate Thinning for Reduced Dis..:

Jacobs, R. N. ; Smith, P. J. ; Markunas, J. K...
Journal of Electronic Materials.  39 (2010)  7 - p. 1036-1042 , 2010
Link: https://doi.org/10.1007/..
 
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15

Cyclic Annealing During Metalorganic Vapor-Phase Epitaxial ..:

Rao, S. R. ; Shintri, S. S. ; Markunas, J. K...
Journal of Electronic Materials.  39 (2010)  7 - p. 996-1000 , 2010
Link: https://doi.org/10.1007/..
 
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