Marques, Cleiton
150  Ergebnisse:
Personensuche X
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4

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM A..:

, In: 2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI),
 
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9

An Analytical Approach to Calculate Soft Error Rate Induced..:

Wrobel, Frédéric ; Aguiar, Ygor ; Marques, Cleiton...
info:eu-repo/semantics/altIdentifier/doi/10.3390/electronics12010104.  , 2023
 
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10

An Analytical Approach to Calculate Soft Error Rate Induced..:

Wrobel, Frédéric ; Aguiar, Ygor ; Marques, Cleiton...
info:eu-repo/semantics/altIdentifier/doi/10.3390/electronics12010104.  , 2023
 
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