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2023 International Electron Devices Meeting (IEDM) ,
5
A highly reliable 1.8 V 1 Mb Hf0.5Zr0.5O2-based 1T1C FeRAM ..:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
12
Demonstration of Fatigue and Recovery Phenomena in Hf0.5Zr0..:
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2020 IEEE Symposium on VLSI Technology ,
13