Mat Jizat, Jessnor Arif
22  Ergebnisse:
Personensuche X
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1

The Classification of Wafer Defects: An Evaluation of Diffe..:

, In: Lecture Notes in Electrical Engineering; Advances in Intelligent Manufacturing and Mechatronics,
 
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2

The Classification of Wafer Defects: A Support Vector Machi..:

, In: Robot Intelligence Technology and Applications 7; Lecture Notes in Networks and Systems,
 
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5

Advances in Robotics, Automation and Data Analytics 

Selected Papers from iCITES 2020  Advances in Intelligent Systems and Computing ; 1350
 
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8

Evaluation of the Transfer Learning Models in Wafer Defects..:

, In: Lecture Notes in Electrical Engineering; Recent Trends in Mechatronics Towards Industry 4.0,
 
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14

The Diagnosis of Diabetic Retinopathy: A Transfer Learning ..:

, In: Advances in Robotics, Automation and Data Analytics; Advances in Intelligent Systems and Computing,
 
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15

The Diagnosis of COVID-19 Through X-Ray Images via Transfer..:

, In: Advances in Robotics, Automation and Data Analytics; Advances in Intelligent Systems and Computing,
 
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