Matulionis, A.
176  Ergebnisse:
Personensuche X
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Physica status solidi 

Volume 68, Number 2: December 16  Physica status solidi ; Volume 68, Number 2, A
Amelinckx, S ; Aubet, F . D ; Bach, H. G... - Reprint 2021 . , [2022]
 
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Threshold field for soft damage and electron drift velocity..:

Ardaravičius, L ; Kiprijanovič, O ; Liberis, J...
Semiconductor Science and Technology.  30 (2015)  10 - p. 105016 , 2015
 
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Hot-electron real-space transfer and longitudinal transport..:

Šermukšnis, E ; Liberis, J ; Matulionis, A...
Semiconductor Science and Technology.  30 (2015)  3 - p. 035003 , 2015
 
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9

Hot-phonon lifetime in Al0.23Ga0.77N/GaN channels:

Liberis, J ; Ramonas, M ; Šermukšnis, E...
Semiconductor Science and Technology.  29 (2014)  4 - p. 045018 , 2014
 
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10

Compact modelling of InAlN/GaN HEMT for low noise applicati..:

Sakalas, P ; Šimukovič, A ; Piotrowicz, S...
Semiconductor Science and Technology.  29 (2014)  9 - p. 095014 , 2014
 
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11

High frequency noise of epitaxial graphene grown on sapphir:

Ardaravicˇius, L. ; Liberis, J. ; Šermukšnis, E....
physica status solidi (RRL) – Rapid Research Letters.  7 (2013)  5 - p. 348-351 , 2013
 
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Plasmon-controlled optimum gate bias for GaN heterostructur..:

Šimukovič, A ; Matulionis, A ; Liberis, J...
Semiconductor Science and Technology.  28 (2013)  5 - p. 055008 , 2013
 
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Impact of active layer design on InGaN radiative recombinat..:

Li, X. ; Okur, S. ; Zhang, F....
Journal of Applied Physics.  111 (2012)  6 - p. , 2012
 
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15

Window for better reliability of nitride heterostructure fi..:

Matulionis, A. ; Liberis, J. ; Šermukšnis, E....
Microelectronics Reliability.  52 (2012)  9-10 - p. 2149-2152 , 2012
 
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