Mauran, N.
14  Ergebnisse:
Personensuche X
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3

20GHz on-chip measurement of ESD waveform for system level ..:

Caignet, F. ; Nolhier, N. ; Bafleur, M...
Microelectronics Reliability.  55 (2015)  11 - p. 2276-2283 , 2015
 
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4

On-chip measurement to analyze failure mechanisms of ICs un..:

Caigneť, F. ; Nolhier, N. ; Bafleur, M...
Microelectronics Reliability.  53 (2013)  9-11 - p. 1278-1283 , 2013
 
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5

ESD failure signature in capacitive RF MEMS switches:

Ruan, J. ; Papaioannou, G.J. ; Nolhier, N....
Microelectronics Reliability.  48 (2008)  8-9 - p. 1237-1240 , 2008
 
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8

Very high frequency probes for atomic force microscopy with..:

L Schwab (14406972) ; P Allain (14406975) ; N Mauran (14406978)...
https://figshare.com/articles/preprint/Very_high_frequency_probes_for_atomic_force_microscopy_with_silicon_optomechanics/21880815.  , 2021
 
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11

Outcome of adults with Eisenmenger syndrome treated with pu..:

Hascoet, S. ; Fournier, E. ; Legloan, L....
Archives of Cardiovascular Diseases Supplements.  10 (2018)  1 - p. 134 , 2018
 
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13

Circulation/Cardiology 2:

Morville, Patrice ; Mauran, Pierre ; Desplanques, Laurence...
Intensive Care Medicine.  22 (1996)  S2 - p. S193-S194 , 1996
 
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