Personensuche
X
?
2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID) ,
2
Accelerating Defect Simulation in Analog and Mixed-Signal C..:
, In:
?
2022 IEEE International Test Conference (ITC) ,
3
Application of Sampling in Industrial Analog Defect Simulat..:
, In:
?
2022 IEEE International Test Conference (ITC) ,
4
Automatic Structural Test Generation for Analog Circuits us..:
, In:
?
2020 IEEE International Test Conference India ,
5
Fault Vulnerability Ranking of Transistors in Analog Integr..:
, In:
?
2019 IEEE 28th Asian Test Symposium (ATS) ,
7
A Structured Approach for Rapid Identification of Fault-Sen..:
, In:
?
Proceedings of the 2019 Great Lakes Symposium on VLSI ,
8
Fault Classification and Coverage of Analog Circuits using ..:
, In:
?
Proceedings of the conference on Design, automation and test in Europe ,
9