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Mayukh Bhattacharya
43  Ergebnisse:
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1

DAWN: Efficient Trojan Detection in Analog Circuits using C..:

Chaudhuri, Jayeeta ; Bhattacharya, Mayukh ; Chakrabarty, Krishnendu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Accelerating Defect Simulation in Analog and Mixed-Signal C..:

, In: 2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID),
Sanyal, Sayandeep ; Bhattacharya, Mayukh ; Dasgupta, Pallab. - p. 325-330 , 2023
Link: https://doi.org/10.1109/..
 
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3

Application of Sampling in Industrial Analog Defect Simulat..:

, In: 2022 IEEE International Test Conference (ITC),
Bhattacharya, Mayukh ; Solignac, Beatrice ; Durr, Michael - p. 436-445 , 2022
Link: https://doi.org/10.1109/..
 
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4

Automatic Structural Test Generation for Analog Circuits us..:

, In: 2022 IEEE International Test Conference (ITC),
Talukdar, Jonti ; Chaudhuri, Arjun ; Bhattacharya, Mayukh. - p. 145-154 , 2022
Link: https://doi.org/10.1109/..
 
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5

Fault Vulnerability Ranking of Transistors in Analog Integr..:

, In: 2020 IEEE International Test Conference India,
Garapati, Shan Pavan Pani Krishna ; Sanyal, Sayandeep ; Patra, Amit.. - p. 1-8 , 2020
Link: https://doi.org/10.1109/..
 
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6

A Methodology for Identification of Internal Nets for Impro..:

Sanyal, Sayandeep ; Bhattacharya, Mayukh ; Patra, Amit.
Journal of Electronic Testing.  36 (2020)  6 - p. 719-730 , 2020
Link: https://doi.org/10.1007/..
 
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7

A Structured Approach for Rapid Identification of Fault-Sen..:

, In: 2019 IEEE 28th Asian Test Symposium (ATS),
Sanyal, Sayandeep ; Patra, Amit ; Dasgupta, Pallab. - p. 135-1355 , 2019
Link: https://doi.org/10.1109/..
 
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8

Fault Classification and Coverage of Analog Circuits using ..:

, In: Proceedings of the 2019 Great Lakes Symposium on VLSI,
Sanyal, Sayandeep ; Garapati, Shan Pavan Pani Krishna ; Patra, Amit.. - p. 123-128 , 2019
Link: https://dl.acm.org/doi/1..
 
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9

A physical design tool for built-in self-repairable static ..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Chakraborty, Kanad ; Gupta, Anurag ; Bhattacharya, Mayukh.. - p. 137-es , 1999
Link: https://dl.acm.org/doi/1..
 
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10

Nonsyndromic gemination-associated microdontia: A report of..:

Laboni Ghorai ; Mayukh Bhattacharya
http://www.ijds.in/article.asp?issn=0976-4003;year=2023;volume=15;issue=4;spage=191;epage=194;aulast=Ghorai.  , 2023
Link: https://doi.org/10.4103/..
 
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11

A Case of Asymptomatic Atypical Hepatic Hemangioma Discover..:

Soumik Chatterjee ; Mayukh Bhattacharya
issn:2394-7330.  , 2022
Link: https://zenodo.org/recor..
 
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12

Degradation in lead zirconate titanate thin film capacitors..:

Bhattacharya, Mayukh
OCLC# 31256882.  , 1994
Link: http://hdl.handle.net/10..
 
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13

Predicting negative human-tiger (Panthera tigris) interacti..:

Chatterjee, Mayukh ; Chatterjee, Nilanjan ; Chandel, Poonam..
Frontiers in Conservation Science.  3 (2022)  - p. , 2022
Link: https://doi.org/10.3389/..
 
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14

Time-scale-dependent X-ray to UV time lags of NGC 4593 usin..:

Beard, Max W J ; McHardy, Ian M ; Kumari, Kavita...
Monthly Notices of the Royal Astronomical Society.  519 (2022)  1 - p. 91-101 , 2022
Link: https://doi.org/10.1093/..
 
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15

Wireless charging scheme for medium power range application..:

Karthikeyan, D ; Koley, Sayon ; Bagchi, Mayukh..
International Journal of Power Electronics and Drive Systems (IJPEDS).  11 (2020)  4 - p. 1979 , 2020
Link: https://doi.org/10.11591..
 
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