Mehendale, Manjusha
9  Ergebnisse:
Personensuche X
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1

Non-Contact, In-Line Thermal Characterization Capability wi..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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2

Monitoring Critical Process Steps in 3D NAND using Picoseco..:

, In: 2020 China Semiconductor Technology International Conference (CSTIC),
Dai, Johnny ; Mukundhan, Priya ; Mair, Robin... - p. 1-3 , 2020
 
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4

Hot phonon effects in ZnSe:

Mehendale, Manjusha ; Sivananthan, S. ; Pötz, W..
Journal of Electronic Materials.  27 (1998)  6 - p. 752-755 , 1998
 
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7

Efficient pump-probe sampling with a single-cavity dual-com..:

Pupeikis, Justinas ; Hu, Wenxiang ; Willenberg, Benjamin...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.pacs.2022.100439.  , 2023
 
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