E-LIB Suche - Ergebnisse für: Melngailis, J.

1

Understanding Surface Modification of Silicon-based Materia..:

Klein, K.L. ; Huynh, C. ; Stern, L....
Microscopy and Microanalysis. 18 (2012) S2 - p. 830-831 , 2012

Link: https://doi.org/10.1017/..

2

CMOS foundry Schottky diode microwave power detector fabric..:

, In: Digest of Papers. 2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems,

Jeon, W. ; Melngailis, J. - p. 4 pp. , 2006

Link: https://doi.org/10.1109/..

3

Effect of 90° domain movement on the piezoelectric response..:

Ma, Zhengkun ; Zavaliche, F. ; Chen, L....
Applied Physics Letters. 87 (2005) 7 - p. , 2005

Link: https://doi.org/10.1063/..

4

Realizing intrinsic piezoresponse in epitaxial submicron le..:

Nagarajan, V. ; Stanishevsky, A. ; Chen, L....
Applied Physics Letters. 81 (2002) 22 - p. 4215-4217 , 2002

Link: https://doi.org/10.1063/..

5

Dynamics of ferroelastic domains in ferroelectric thin film:

Nagarajan, V. ; Roytburd, A. ; Stanishevsky, A....
Nature Materials. 2 (2002) 1 - p. 43-47 , 2002

Link: https://doi.org/10.1038/..

6

Radiation damage and its recovery in focused ion beam fabri..:

Stanishevsky, A. ; Nagaraj, B. ; Melngailis, J....
Journal of Applied Physics. 92 (2002) 6 - p. 3275-3278 , 2002

Link: https://doi.org/10.1063/..

7

Ion Beam Lithography:

, In: Encyclopedia of Materials: Science and Technology,

Melngailis, J. - p. 4274-4280 , 2001

Link: https://doi.org/10.1016/..

8

High density ferroelectric memories: Materials, processing ..:

Aggarwal, S. ; Ganpule, C. ; Jenkins, I. G....
Integrated Ferroelectrics. 28 (2000) 1-4 - p. 213-225 , 2000

Link: https://doi.org/10.1080/..

9

Quantitative imaging of dielectric permittivity and tunabil..:

Steinhauer, D. E. ; Vlahacos, C. P. ; Wellstood, F. C....
Review of Scientific Instruments. 71 (2000) 7 - p. 2751-2758 , 2000

Link: https://doi.org/10.1063/..

10

Accurate location and marking of grain boundaries using foc..:

Machalett, F ; Edinger, K ; Melngailis, J..
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 170 (2000) 3-4 - p. 474-482 , 2000

Link: https://doi.org/10.1016/..

11

Focused-ion-beam writing of electrical connections into pla..:

Machalett, F. ; Edinger, K. ; Ye, L....
Applied Physics Letters. 76 (2000) 23 - p. 3445-3447 , 2000

Link: https://doi.org/10.1063/..

12

Coulomb interactions in a focused ion beam column and desig..:

Didenko, L ; Guharay, S.K ; Orloff, J.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 427 (1999) 1-2 - p. 121-125 , 1999

Link: https://doi.org/10.1016/..

13

Scaling of ferroelectric and piezoelectric properties in Pt..:

Ganpule, C. S. ; Stanishevsky, A. ; Aggarwal, S....
Applied Physics Letters. 75 (1999) 24 - p. 3874-3876 , 1999

Link: https://doi.org/10.1063/..

14

Scaling of ferroelectric properties in thin films:

Ganpule, C. S. ; Stanishevsky, A. ; Su, Q....
Applied Physics Letters. 75 (1999) 3 - p. 409-411 , 1999

Link: https://doi.org/10.1063/..

15

Imaging of microwave permittivity, tunability, and damage r..:

Steinhauer, D. E. ; Vlahacos, C. P. ; Wellstood, F. C....
Applied Physics Letters. 75 (1999) 20 - p. 3180-3182 , 1999

Link: https://doi.org/10.1063/..