Mengotti, E.
23  Ergebnisse:
Personensuche X
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1

Temperature Dependent Transient Threshold Voltage Hysteresi..:

, In: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Mengotti, E. ; Bianda, E. ; Baumann, D.... - p. 259-262 , 2021
 
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2

Study of moisture transport in silicone gel for IGBT module:

Zhang, K. ; Schlottig, G. ; Mengotti, E...
Microelectronics Reliability.  114 (2020)  - p. 113773 , 2020
 
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3

Physics-of-failure assessment methodology for power electro..:

Squiller, D. ; Greve, H. ; Mengotti, E..
Microelectronics Reliability.  54 (2014)  9-10 - p. 1680-1685 , 2014
 
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4

Eliminating infant mortality in metallized film capacitors ..:

McCluskey, F.P. ; Li, N.M. ; Mengotti, E.
Microelectronics Reliability.  54 (2014)  9-10 - p. 1818-1822 , 2014
 
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5

Fretting corrosion: Analysis of the failure mechanism for l..:

Mengotti, E. ; Duarte, L.I. ; Pippola, J..
Microelectronics Reliability.  54 (2014)  9-10 - p. 2109-2114 , 2014
 
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8

Artificial kagome spin ice: dimensional reduction, avalanch..:

Hügli, R. V. ; Duff, G. ; O'Conchuir, B....
Philosophical Transactions: Mathematical, Physical and Engineering Sciences.  370 (2012)  1981 - p. 5767-5782 , 2012
 
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